Investigation of sputter-induced surface nano-structuring by highly charged ions (HCI)

Informations projet

HCI

N° de convention de subvention: HPMF-CT-2002-02138

Date de début 1 Mars 2003

Date de fin 28 Février 2005

Financé au titre de

• Programme for research, technological development and demonstration on "Improving the human research potential and the socio-economic knowledge base" (1998-2002)

Coût total € 125 550,00

Contribution de l’UE € 125 550,00

Coordonné par

N/A

Objectif

We investigate secondary particle emission phenomena after ion-surface collisions of HCIs combining imaging- TOF- and laser-induced post-ionisation techniques. By measuring double differential sputtering yields information about energy deposition in nano-structuring processes is gained.

Programme(s)

• FP5-HUMAN POTENTIAL - Programme for research, technological development and demonstration on "Improving the human research potential and the socio-economic knowledge base" (1998-2002)

Thème(s)

Data not available

Appel à propositions

Data not available

Régime de financement

RGI - Research grants (individual fellowships)

Coordinateur

N/A

• Contribution de l’UE: Aucune donnée
• Coût total: Aucune donnée