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Final Report - NUOTO (New materials with Ultra high k dielectric constant fOr TOmorrow wireless electronics)

Project ID: 32644
Funded under: FP6-NMP


The final report of the NUOTO project outlines how metal-oxide-metal capacitors based on CaCu3Ti4O12 (CCTO) thin films, grown by metal-organic chemical vapour deposition and presenting a brick wall morphology, have been fabricated and characterised. In these capacitors, the coexistence of two Maxwell-Wagner related phenomena, the internal barrier layer capacitor and the electrode polarisation effects, has been demonstrated and modelled. The detailed description of the involved mechanisms is discussed. High reliability and reproducibility in capacitors based on CCTO thin films can be achieved when the phenomena are controlled. A remarkable high capacitance density has been obtained at room temperature in optimised processing.

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