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The techniques of secondary ion mass spectrometry (SIMS) and sputtered neutral mass spectrometry (SNMS) have been developed for the study of specific chemical microanalysis applications encountered with commercial steel products and processes where conventional analytical methods are less than satisfactory. The three areas of application were nitrogen pick up during bright annealing, light element distribution mapping and the identification of the source of nonmetallic material in steel inclusions. Electron impact SNMS has been developed for the quantitative analysis of steel surfaces. A liquid gallium primary ion beam capable of producing spot sizes of less than one micron has been used to investigate the chemical distribution of carbon, nitrogen and boron present as particulates and segregants. Lanthanum oxide additions have been used successfully to dope steelmaking slags in order to identify positively the origins of oxide inclusions in steels. Cerium and europium have been identified as alternative chemical tracers should lanthanum oxide prove to be inappropriate because of high background levels or the requirement to perform a multiple doping experiment.

Additional information

Authors: ENGLISH T, British Steel, Swinden Technology Centre, Rotherham (GB)
Bibliographic Reference: EUR 15816 EN (1996) 43pp., FS, ECU 7
Availability: Available from the (2)
ISBN: ISBN 92-827-7202-0
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