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  • Direct trace element analysis by atomic emission spectrometry with a high energy source: Part II: Investigation of a new more efficient and compact source


The purpose of this research was to examine the possibility of boosting the sensitivity of the low-pressure source by direct coupling with a microwave source. The studies concentrated mainly on defining the best low-pressure source geometry for microwave interaction, and the technique for direct coupling with the microwaves, eliminating the waveguide. The best performance was obtained with the dual chamber source. The highest increase in emission was obtained with samples turned in the shape of a hollow cathode. Microwave coupling was realized by means of an antenna. The effects of microwave irradiation on glow discharge and on emission were checked by analyzing forged hollow cathode samples. Some elements were found to be extremely sensitive to microwaves, while on others microwave irradiation either had no effects at all or, in some cases, even harmful effects.

Additional information

Authors: DEL MONTE M, Centro sviluppo materiali SpA, Roma (IT);LO PICCOLO E, Centro sviluppo materiali SpA, Roma (IT);CILIA M, Centro sviluppo materiali SpA, Roma (IT);GUANTERA G, Centro sviluppo materiali SpA, Roma (IT)
Bibliographic Reference: EUR 16702 IT (1997) 47pp., FS, ECU 8.50
Availability: Available from the (2)
ISBN: ISBN 92-828-1023-2
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