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The efficient expert system SAM has been created for the optimization of the use of X-ray fluorescence analysis. With this system possibilities are opened up for minimizing the expenditure on tests. All conclusions of the expert system for the analysis strategy to be applied are based on the knowledge of what material is involved in the particular analysis sample. Should there not be any information on the analysis sample available, a material classification routine is started which as a result of the use of the fuzzy logic permits the processing of semi-quantitative measuring results containing a relatively large number of errors. The expert system handles all the required tasks of analysis management for any analysis sample. On the basis of the material classification SAM determines the optimum sample preparation method for the production of an analysis sample and selects form existing analysis programs the one which is most advantageous for the particular analytical problem. It is possible to determine the optimum preparation strategy for an analysis sample and to determine all the equipment parameters necessary for measuring within a very short time. The system can be used for any analytical method after appropriate extension.

Additional information

Authors: OTTO M, TU Bergakademie Freiberg (DE);FLOCK J, Krupp Hoesch Stahl AG, Dortmund (DE)
Bibliographic Reference: EUR 18010 DE (1998) 76pp., ECU 13.50
Availability: Available from the (2)
ISBN: ISBN 92-828-2718-6
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