Servizio Comunitario di Informazione in materia di Ricerca e Sviluppo - CORDIS

Cryogenic system for electrical characterization of DEW devices at high frequencies

Design, fabrication and testing of the measurement set-up for on-wafer HF characterization of electronic devices within 20K-300K temperature range, including a vacuum set-up with low-vibration interface and a computer-controlled positioning system for the co-planar HF probes.

Applicable immediately to any research projects about electronic device application, potentially of value over many years.

Electrical characterization of other electronic devices, like GaN-based HEMTs, surface channel FETs on diamond and diamond-based MEMS structures.

Reported by

Technische Universitaet Darmstadt
Hochschulstrasse 4A
64289 DARMSTADT
Germany
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