Wspólnotowy Serwis Informacyjny Badan i Rozwoju - CORDIS

Double wavelength transverse probe lifetime measurement set-up

A contactless, all-optical and non-destructive technique for simultaneous measurement of minority carrier recombination lifetime and surface recombination velocity, at low injection level, in silicon samples is presented. Being contactless and non-destructive with respect to the surface to be analysed, the method is suitable for routine lifetime characterisation in solar cell process. The technique is applicable to the measurement of bulk recombination lifetime and surface recombination velocity on thin multi-crystalline Silicon samples

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University of Naples
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