Wspólnotowy Serwis Informacyjny Badan i Rozwoju - CORDIS


NANOBEAMS Streszczenie raportu

Project ID: 500440
Źródło dofinansowania: FP6-NMP
Kraj: Luxembourg

Final Report Summary - NANOBEAMS (Nanoanalysis using finely focused ion and electron beams)

Taking into account that the partners have been engaged in several projects including the world leading Secondary ion mass spectrometry (SIMS) manufacturers (i.e. CAMECA and ION-TOF), the NANOBEAMS NoE has had an enormous impact on its research sector, as well as industry. Thus, the outcome of the various research projects integrated within NANOBEAMS will enable the SIMS manufacturers to continue developing improved and efficient instrumentation and to keep the lead in the area of nano-analysis.

Thanks to the NANOBEAMS NoE, the development of a new technique combining SFM and ToF-SIMS is already underway. Being coordinated by the world leader for ToF-SIMS, this project will give the project partners the opportunity to submit further patents and to commercialise a new product. During the course of the project, a prototype for performing quantitative analysis nano-analysis was developed (patent pending). The outcome of this project was presented at several conferences. Using the knowledge and experience gained within the NANOBEAMS NoE, the CRP-GABRIEL LIPPMANN is able to use this instrument for analysis.

The creation of the European PhD school on the topic of 'Nano-analysis using finely focussed ion and electron beams' will have a large impact on the research sector of nano-analysis. Being the outcome of the collaboration between the NANOBEAMS partners, as well as the University of Luxembourg, this PhD school is now integrated in the university's curriculum. Taking into account that the university was only created in 2003, the PhD school will also give a boost to the further development of the Luxembourgish research sector and as a consequence to the Luxembourgish economy.

The various user schools organised by the world-leader in SIMS and high-resolution Auger Spectroscopy as well as the advanced training courses on state-of-the-art Transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS) and Scanning probe microscopy (SPM) instrumentation gave the opportunity to the user community to further improve their skills. Furthermore, the industry had the opportunity to present their latest state-of-the-art instrumentation to a large number of future customers in the research community.

Even though the objective for reaching a lateral resolution in SIMS was not fully achieved, overall, the NANOBEAMS NoE has fulfilled its objectives. Technical progress has been made in several areas of key importance in the development of reliable techniques and methodologies for high resolution chemical analysis of a wide range of sample types, these have been widely reported in the scientific literature and to appropriate international audiences at major conferences, and some of these technical advances have led to improvements in commercial instrumentation. These outcomes all contribute to the international perception of the high quality of the science base in the EU, and to the competitiveness of EU industry in technical instrumentation.

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