Composition related properties of very thin films on steel products: rapid quantitative analysis by DC GD-OES

Ziel

This proposal is aimed at developing a new method based on quantitative depth profile analysis by DC GD-OES, which permits rapid multi-element analysis of very thin films (passive films on stainless steels, conversion layers on plane and coated steel sheets,), with the following technical specifications: minimum information depth about 5nm; multi-element capability of 20 elements in one measurement; quantification of major and minor elements with an accuracy better than 10%; analysis time (measurement + quantification) of a few minutes for very thin layers.

Programm/Programme

ECSC-STEELRES 8C - Medium-term guidelines (ECSC) for the programmes of technical steel research and of steel pilot/demonstration projects, 1991-1995

Thema/Themen

E - Analytical Techniques for Processes, Products & Environment

Aufforderung zur Vorschlagseinreichung

Data not available

Finanzierungsplan

Data not available

Koordinator

INSTITUTET FÖR METALLFORSKNING, ANSLAGSSTIFTELSE

EU-Beitrag

Keine Daten

Adresse

Drottning Kristinas väg 48
114 28 STOCKHOLM
Schweden

Gesamtkosten