Objective Development of methods and instrumentation for structure characterization below the 0.1 mm level. By combining the know?how of European Universities and Industries it is possible to construct a unique electron microscope which can reach beyond the physical limit of characterize the atomic structure and chemical composition will be used for materials where knowledge on structural deviations at an atomic scale is essential for understanding these properties. In contrast to the brute force method in which the point resolution of electron microscopies is pushed down 1 angstrom by increasing the voltage above 1 Mev, a different route has been adopted in which the information limit is pushed down and the information is retrieved by image processing. This has been achieved by using a coherent electron source and optimizing the lens design, the detector configuration and the alignment procedure. The phase is recovered by 2 different methods: sideband holography and focus variation, whereas for the object structure retrieval, a new method has been developed to 'reverse' in a sense the dynamic scattering in the object. All hardware and software has proven to be working reliably and yeilding 1 angstrom structural information.A fundamentally new method of phase and structure retrieval by focus variation, developed in the University of Antwerp, together with an auto alignment method developed in Delft forms the key issue. A second method-electron holography developed at the University of Tubingen can lead to the same result employing almost the same microscope. The hardware consists of a special electron microscope designed by Phillips with an image detector designed by University of Tubingen. Also to be designed by Tietz Video and Image processing Systems GmbH is an ultra fast image processing system. This combination of know how is unique in the world and will make the instrument by far superior to the Japanese competition. Fields of science natural sciencescomputer and information sciencessoftwarenatural sciencesphysical sciencesopticsmicroscopyelectron microscopy Programme(s) FP2-BRITE/EURAM 1 - Specific research and technological development programme (EEC) in the fields of industrial manufacturing technologies and advanced materials applications (BRITE/EURAM), 1989-1992 Topic(s) Data not available Call for proposal Data not available Funding Scheme Data not available Coordinator Philips EU contribution No data Address Kastanjelaan 1, Build Saq-1 5600 MD EINDHOVEN Netherlands See on map Total cost No data Participants (4) Sort alphabetically Sort by EU Contribution Expand all Collapse all DELFT UNIVERSITY OF TECHNOLOGY Netherlands EU contribution No data Address Julianalaan 134 See on map Total cost No data THE UNIVERSITY OF TUEBINGEN Germany EU contribution No data Address AUF DER MORGENSTELLE 1 72074 TUEBINGEN See on map Total cost No data TIETZ VIDEO AND IMAGE PROCESSING GMBH Germany EU contribution No data Address See on map Total cost No data UNIVERSITY OF ANTWERP Belgium EU contribution No data Address Prinsstraat 13 See on map Total cost No data