Objectif The main aim of the IMPROD project is to insert enhanced statistical methods and processing control tools into the current IC manufacturing environment of two semiconductor manufacturing companies (SGS-Thomson and Bosch) in order to substantially increase process and product quality. The first release of a test and parametric data management package was installed in an integrated circuit (IC) manufacturing line, including the ability to generate automatically Cpk values for process steps. An initial set of tools for engineering analysis has been implemented. Examination of the process methods employed in microelectronic manufacturing has resulted in a proposed statistical methodology using multivariate analysis to detect relationships and dependencies in the production parameters, and a methodology has been defined which will automatically detected unwanted variation. Modelling of test structures has produced optimum new designs to be used on the semiconductor wafers so that essential process parameters can be extracted from the wafer. The choice of data management methods, statistical analysis tools and selection of database format have been greatly assisted by the commercial software partner in the project. The tools developed in the project have been designed to be able to draw data from a variety of database systems.The project will add the following to current process and device engineering capabilities: - an expert system (using updated statistical methodology) to help improve the whole process of designing, manufacturing and testing ICs - an information system to facilitate access to data belonging to different process steps (process measurement, wafer testing, final product output) with added special features to collect data by wafer and position on the wafer, validated and without redundancies: this will cover all the manufacturing sites that the product moves between during the maturity cycle (design, engineering production and volume production) - application of the new tools in a real production scenario (multisite and multistep) in order to test the possibility of employing final quality control by variables rather than by attributes. The improved system will be used for quality control in the production of automotive products at the two semiconductor manufacturers. Bench-mark testing for the new system will be performed against the existing factory systems (which involve control by attributes rather than by variables) to demonstrate improved product quality. The goal is to improve this up to the level of equivalent Japanese products. Champ scientifique natural sciencescomputer and information sciencessoftwarenatural sciencescomputer and information sciencesdatabasesnatural sciencescomputer and information sciencesartificial intelligenceexpert systemsnatural sciencesphysical scienceselectromagnetism and electronicssemiconductivity Programme(s) FP3-ESPRIT 3 - Specific research and technological development programme (EEC) in the field of information technologies, 1990-1994 Thème(s) Data not available Appel à propositions Data not available Régime de financement Data not available Coordinateur Consorzio Milano Ricerche Contribution de l’UE Aucune donnée Adresse Via L Cicognara 7 20129 Milano Italie Voir sur la carte Coût total Aucune donnée Participants (5) Trier par ordre alphabétique Trier par contribution de l’UE Tout développer Tout réduire CMSU-COMMUNICATION AND MANAGEMENT SYSTEM UNIT Grèce Contribution de l’UE Aucune donnée Adresse ZOGRAPHOU CAMPUS 15773 ATHENES Voir sur la carte Coût total Aucune donnée Queen's University of Belfast Royaume-Uni Contribution de l’UE Aucune donnée Adresse Stranmillis Road BT9 5AH Belfast Voir sur la carte Coût total Aucune donnée ROBERT BOSCH GMBH Allemagne Contribution de l’UE Aucune donnée Adresse TUEBINGER STRASSE 123 72762 REUTLINGEN Voir sur la carte Coût total Aucune donnée TXT Ingegneria Informatica SpA Italie Contribution de l’UE Aucune donnée Adresse Via Socrate, 41 20128 Milano Voir sur la carte Coût total Aucune donnée Thomson Microelectronics Srl (SGS) Italie Contribution de l’UE Aucune donnée Adresse Via Carlo Olivetti 20041 Agrate Brianza Milano Voir sur la carte Coût total Aucune donnée