High-resolution, non-invasive electron microscopy
Physical phenomena that take place at material interfaces have important implications for a wide range of fields, including energy technologies and membrane biology. The EU-funded ONEM project will work on a new microscopy technique called optical near-field electron microscopy that is non-invasive and offers high spatial and temporal resolutions. The new technique will enable label- and damage-free imaging at a spatial resolution of 3 nm and frame rates up to kHz, over extended time periods. It could thus aid in investigating a wide range of electrochemical phenomena (corrosion, mass transport) in battery technologies or mechanisms in membrane biology (pore formation, oligomerisation or protein diffusion), which are not possible to study with state-of-the-art imaging technologies.
Fields of science
Call for proposal
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