Objective
The objectives of this project were to:
1.Set up an intrinsic gettering (IG) process for wafers with medium to high oxygen concentration. The process was to have been independent of the type (porn) of the substrate and able to produce a highly defective bulk region and a defectfree denudedzone. A zone thickness of around 110micron was identified as the best compromise for several factors (such as leakage current and insensitivity to latch up a soft error).
2.Characterise EPI wafer diameters of 4 and 6inches. The thickness of the epilayer was to have been in the range 510micron, for both p+ and n+substrates. This thickness range is suitable for submicron CMOS. Finally, IG and EPI processes were eventually to match in order to have intrinsically gettered, low-leakage EPI wafers for submicron CMOS devices insensitive to soft errors.
The objectives of this project were to:
set up an intrinsic gettering (IG) process for wafers with medium to high oxygen concentration;
characterise energy and process integration (EPI) wafer diameters of 4 and 6 inches;
Initial work was carried out on both the correlation between intrinsic defects, processes and device electrical performance, and also in the area of self interstitials (injected by oxygen precipitation and by source to drain ion implantation) as a cause of leakage and lifetime degradation. The final area of work addressed by the project was the design of the preaneal process to match the desired defectiveness and lifetime characteristics.
Problems in the supply of EPIwafers caused delays the first year. This situation improved in the second year, and some of the main targets were achieved at the end of the two-year contract. Initial work was carried out on both the correlation between int rinsic defects, processes and device electrical performance, and also in the area of self-interstitials (injected by oxygen precipitation and by sourcetodrain ion implantation) as a cause of leakage and lifetime degradation.
The final area of work addressed by the project was the design of the pre-anneal process to match the desired defectiveness and lifetime characteristics.
Programme(s)
Multi-annual funding programmes that define the EU’s priorities for research and innovation.
Multi-annual funding programmes that define the EU’s priorities for research and innovation.
Topic(s)
Calls for proposals are divided into topics. A topic defines a specific subject or area for which applicants can submit proposals. The description of a topic comprises its specific scope and the expected impact of the funded project.
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Calls for proposals are divided into topics. A topic defines a specific subject or area for which applicants can submit proposals. The description of a topic comprises its specific scope and the expected impact of the funded project.
Call for proposal
Procedure for inviting applicants to submit project proposals, with the aim of receiving EU funding.
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Procedure for inviting applicants to submit project proposals, with the aim of receiving EU funding.
Funding Scheme
Funding scheme (or “Type of Action”) inside a programme with common features. It specifies: the scope of what is funded; the reimbursement rate; specific evaluation criteria to qualify for funding; and the use of simplified forms of costs like lump sums.
Funding scheme (or “Type of Action”) inside a programme with common features. It specifies: the scope of what is funded; the reimbursement rate; specific evaluation criteria to qualify for funding; and the use of simplified forms of costs like lump sums.
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Coordinator
20041 Agrate Brianza Milano
Italy
The total costs incurred by this organisation to participate in the project, including direct and indirect costs. This amount is a subset of the overall project budget.