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Massively extended Modular Monitoring for Upper Stages

Deliverables

Report on Preliminary System Architecture

Description of first version of the system architecture

Report on fault injection and self-testing on a selected case study (draft)

Report on fault injection and self-testing on a selected case study (draft)

Benchmarking report for advanced dependability techniques

Benchmarking report for advanced dependability techniques

Report on proposed dependability evaluation techniques

Report on proposed dependability evaluation techniques

Report on proposed dependability enhancement techniques (final with results)

Report on aproposed dependability enhancement techniques (final with results)

Report on proposed dependability enhancement techniques (draft)

Report on proposed dependability enhancement techniques (draft)

Publications

About On-line Functionally Untestable Fault Identification in Microprocessor Cores for Safety-Critical Applications

Author(s): R. Cantoro, A. Firrincieli, D. Piumatti, M. Restifo, E. Sanchez, M. Sonza Reorda
Published in: IEEE Latin American Test Symposium (LATS), 2018
Publisher: IEEE

On the Optimization of SBST Test Program Compaction

Author(s): Riccardo Cantoro, Ernesto Sanchez, Matteo Sonza Reorda, Giovanni Squillero and Emanuele Valea
Published in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2017
Publisher: IEEE

Automated test program reordering for efficient SBST

Author(s): R. Cantoro, E. Cetrulo, E. Sanchez, M. Sonza Reorda, A. Voza
Published in: 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 2017, Page(s) 1-6, ISBN 978-1-5386-5108-7
Publisher: IEEE
DOI: 10.1109/DCIS.2017.8311634

On the Compression of Spacecraft Housekeeping Data using Discrete Cosine Transforms

Author(s): Meß, J.-G. and Schmidt, R. and Fey, G., Dannemann, F.
Published in: ESA International Workshop on Tracking, Telemetry and Command Systems for Space Applications, 2016
Publisher: IEEE

Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects

Author(s): Tino Flenker, Jan Malburg, Görschwin Fey, Serhiy Avramenko
Published in: IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2017
Publisher: IEEE

On the test of a COTS-based system for space applications

Author(s): S. Carbonara, A. Firrincieli, M.Sonza Reorda, J.-G.Mess
Published in: IEEE International On-Line Testing Symposium (IOLTS), 2018
Publisher: IEEE

An analysis of test solutions for COTS-based systems in space applications

Author(s): R. Cantoro, S. Carbonara, A. Floridia, E. Sanchez, M. Sonza Reorda, J.-G. Mess
Published in: IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SOC), 2018
Publisher: IEEE

Massively Extended Modular Monitoring and a Second Life for Upper Stages

Author(s): J.-G. Mess, M. Sonza Reorda, M. Violante, F. Dannemann, B. Hanson, N. Karlsson, T. Kuremyr, S. Söderholm, Y. Albert, J. Spiecker
Published in: Proceedings of the International Astronautical Congress (IAC) 2018, 2018
Publisher: International Astronautical Confederation

On the robustness of compression algorithms for space applications

Author(s): Avramenko, S. and Sonza Reorda, M. and Violante, M. and Fey, G. and Meß, J.-G. and Schmidt, R.
Published in: IEEE International On-Line Testing Symposium (IOLTS), 2016
Publisher: IEEE

Adaptive compression schemes for housekeeping data

Author(s): Jan-Gerd Mes, Robert Schmidt, Gorschwin Fey
Published in: 2017 IEEE Aerospace Conference, 2017, Page(s) 1-12, ISBN 978-1-5090-1613-6
Publisher: IEEE
DOI: 10.1109/AERO.2017.7943580

Exploiting Error Detection Latency for Parity-based Soft Error Detection

Author(s): Aydos, Gökçe and Fey, Görschwin
Published in: IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2016
Publisher: IEEE

On the analysis of the effects of soft errors on compression algorithms

Author(s): Avramenko, S. and Sonza Reorda, M. and Violante, M. and Fey, G
Published in: IEEE Latin American Test Symposium (LATS), 2016
Publisher: IEEE

A High-Level Approach to Analyze the Effects of Soft Errors on Lossless Compression Algorithms

Author(s): Serhiy Avramenko, Matteo Sonza Reorda, Massimo Violante, Görschwin Fey
Published in: Journal of Electronic Testing: Theory and Applications (JETTA), 2017, ISSN 0923-8174
Publisher: Kluwer Academic Publishers

Empirical results on parity-based soft error detection with software-based retry

Author(s): Gökçe Aydos, Goerschwin Fey
Published in: Microprocessors and Microsystems, 48, 2017, Page(s) 62-68, ISSN 0141-9331
Publisher: Elsevier BV
DOI: 10.1016/j.micpro.2016.09.009