Microwave Microscopy for Advanced and Efficient Materials Analysis and Production

Livrables

Commercial exploitation plans - In relation with task 7.4

At least two example datasets of representative measurements of characteristic samples to demonstrate SMM capabilities and challenges (T6.5)

At least two example datasets of representative measurements of characteristic samples to demonstrate SMM capabilities and challenges.

At least three SOPs on setting up and conducting measurements with the SMM, dielectric resonators and coaxial probes to enable a maximum of reproducibility (T6.4)

At least three SOPs on setting up and conducting measurements with the SMM, dielectric resonators and coaxial probes to enable a maximum of reproducibility.

three SOPs on setting up and conducting measurements with the SMM, dielectric resonators and coaxial probes to enable a maximum of reproducibility - Update of D6.4 - Include integrated feedback from stakeholders (T6.4)

Technical workshop summary (T7.3)

Technical workshop summary - in relation with Task 7.3

"Minutes of official project meeting #3 (T8.1)"

"Minutes of official project meeting #3 - In relation with Task 8.1"

"Newsletter #1 (T7.2)"

"Newsletter #1 - in relation with Task 7.2"

"Newsletter #4 (T7.2)"

"Newsletter #4 - in relation with Task 7.2"

Web interface for open innovation environment (T6.2)

Web interface for open innovation environment.

"Newsletter #2 (T7.2)"

"Newsletter #2 - in relation with Task 7.2"

Project website (T7.2)

Project website - in relation with Task 7.2

Two open platform tools (standalone tool and GUI) and one example for tip-sample interaction in EMPro (T3.4)

Two open platform tools (standalone tool and GUI) and one example for tip-sample interaction in EMPro.

"Newsletter #3 (T7.2)"

"Newsletter #3 - in relation with Task 7.2"

Calibration software for higher-resolution dielectric resonator imaging of larger-scale film samples and a database of reference data in Gwyddion format (T4.4)

Calibration software for higher-resolution dielectric resonator imaging of larger-scale film samples and a database of reference data in Gwyddion format.

Two hands-on workshops on SOP, developed in iteration with interest groups, for SMM calibration delivered to broader public (T6.4)

Two hands-on workshops on SOP, developed in iteration with interest groups, for SMM calibration delivered to broader public.

Demonstration workshop summary (T7.4)

Demonstration workshop summary - in relation with Task 7.4

Publications

Microwave Microscopy for Advanced and Efficient Materials Analysis and Productio

Auteurs: Gilles Dambrine, Petr Povolodov, Didier Théron, KamelHaddadi
Publié dans: 2019
Éditeur: IEMN
DOI: 10.5281/zenodo.3462031

Press release announcing the MMAMA MIKON workshop

Auteurs: L. Naiglin, P. Lenain
Publié dans: 2020
Éditeur: NA
DOI: 10.5281/zenodo.4009158

"Video presenting: ""MMAMA, Microwave Microscopy for Advanced and Efficient Materials Analysis and Production"""

Auteurs: K. Haddadi, L. Naiglin, O. Douheret, S. Ben Dkhil, G. Koutsokis, P. Lenain
Publié dans: 2020
Éditeur: AYMING

"Press release: ""H2020: Microwave Microscopy for Advanced and Efficient Materials Analysis and Production"""

Auteurs: Jetta Keranen
Publié dans: 2019
Éditeur: AYMING

Oral presentation: Overview of Scanning Microwave Microscopy

Auteurs: Kienberger, Ferry; Gramse, Georg
Publié dans: 2019
Éditeur: KEYSIGHT
DOI: 10.5281/zenodo.3257132

"Screencasts of MMAMA workshop on: ""Electrical Material Parameters and Impedance Measurement Techniques in the Project MMAMA"""

Auteurs: Kamel Haddadi, Didier Theron, François Piquemal, Wojciech Gwarek, José Antonio Morán Meza, Georg Gramse, David Moerman, Olivier Douheret
Publié dans: 2020
Éditeur: METAS

A near-field scanning microwave microscope in a scanning electron microscope: design and challenges.

Auteurs: P. Polovodov; S. Eliet; O. Haenssler; G. Dambrine; K. Haddadi; D. Théron
Publié dans: 2019
Éditeur: NA

Second year results MMAMA leaflet

Auteurs: L Naiglin
Publié dans: 2020
Éditeur: NA
DOI: 10.5281/zenodo.4009146

"MMAMA Newsletter #4 July 2020"

Auteurs: L. Naiglin, B. Cruchon, G. Koutsoukis
Publié dans: 2020
Éditeur: NA
DOI: 10.5281/zenodo.4006161

Integration of a Free Space monostatic instrumentation into Adamant Composites Ltd. R2R pilot line for the production of functionalized prepregs

Auteurs: G. Koutsoukis
Publié dans: 2020
Éditeur: ADAMANT
DOI: 10.5281/zenodo.4327544

"Article on Linkedin: ""MMAMA: an Innovative European Platform for Microwave Testing and Control for Nanotechnology Materials"""

Auteurs: P. Lenain, L. Naiglin
Publié dans: 2020
Éditeur: AYMING

" MMAMA_Newsletter#2-Oct 2018 "

Auteurs: Lenain, Philippe
Publié dans: NA, Numéro NA, 2018, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2740308

Deliverable on the project website

Auteurs: Aurore Niemiec
Publié dans: NA, Numéro NA, 2018, Page(s) NA
Éditeur: MMAMA
DOI: 10.5281/zenodo.2581075

MMAMA_Leaflet

Auteurs: Lenain, Philippe
Publié dans: NA, Numéro NA, 2018, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2740682

MOdelling DAta providing a description for Near-field Excited Semiconductor Structure simulated in project MMAMA

Auteurs: Smajic, Jasmin; Celuch, Malgorzata; Kienberger, Ferry
Publié dans: Numéro 1, 2019
Éditeur: NA
DOI: 10.5281/zenodo.2577307

Linked in account of MMAMA project

Auteurs: Philippe Lenain
Publié dans: NA, Numéro NA, 2019, Page(s) NA
Éditeur: NA

Metadata for Scanning Microwave Microscope, Dielectric Probe Kit and Dielectric Resonator

Auteurs: Vasyukov, Denis; Hoffmann, Johannes; Buchter, Arne; Gramse, Georg; Kienberger, Ferry; Rudnicki, Janusz; Celuch, Malgorzata
Publié dans: NA, Numéro NA, 2019, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2591368

Calibration software for higher-resolution dielectric resonator imaging of larger-scale film samples and a database of reference data in Gwyddion format

Auteurs: Malgorzata CELUCH; Wojciech GWAREK; Andrzej WIECKOWSKI
Publié dans: NA, Numéro NA, 2018, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2581083

"MMAMA_Newsletter#1-Feb 2018"

Auteurs: Philippe LENAIN, Gilles Dambrine
Publié dans: NA, Numéro NA, 2018, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2581046

ZENODO community of MMAMA project

Auteurs: Johannes Hoffmann
Publié dans: NA, Numéro NA, 2018, Page(s) NA
Éditeur: NA

Probing (di)electric properties of organic photovoltaic nanostructures with near-field scanning microwave microscopy

Auteurs: Douheret, Olivier; Dambrine, Gilles; Hoffmann, Johannes; Celuch, Malgorzata; Smajic, Jasmin; Kienberger, Ferry; Hallet, Aurelien; Koutsoukis, Grigorios; Lenain, Philippe
Publié dans: 7th KO-EU NanoWorkshop, Seoul, Korea, Nov 12, 2018, Numéro NA, 2018, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2566389

MMAMA - Microwave Microscopy for Advanced and Efficient Materials Analysis and Production

Auteurs: Malgorzata Celuch
Publié dans: IEEE MTT-S IMS, https://ims2018.org/, Philadelphia, PA-USA, June 10-15, 2018, Numéro NA, 2018, Page(s) NA
Éditeur: NA

MMAMA - Microwave Microscopy for Advanced and Efficient Materials Analysis and Production

Auteurs: Malgorzata CELUCH; Gilles Dambrine; Jetta Keranen; Aurélien Hallet; Katerina Kouravelou; Olivier Douheret; Ferry Kienberger; Johannes Hoffmann
Publié dans: European Materials Characterization Council (EMCC) – Members meeting on “Support and coordination of EU actions on advanced materials characterization”, Brussels, Belgium, June 11th, 2018., Numéro NA, 2018, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2581097

MMAMA - Microwave Microscopy for Advanced and Efficient Materials Analysis and Production

Auteurs: Grigorios Koutsoukis
Publié dans: Patras Innovation Quest (Patras IQ) exhibition on the 12th, 13th and 14th of April 2019 (https://www.patrasiq.gr/index_en.php), Numéro NA, 2019, Page(s) NA
Éditeur: NA

MMAMA - Microwave Microscopy for Advanced and Efficient Materials Analysis and Production

Auteurs: Katerina Kouravelou, Dimitris Vlachos, Antonios Vavouliotis
Publié dans: ECCM18, 18th European Conference on Composites Materials, www.eccm18.org, June 24-28th, 2018, Athens (Greece), Numéro NA, 2018, Page(s) NA
Éditeur: NA

Data acquisition with Coaxial Dielectric Probes

Auteurs: Gramse, Georg; Alic, Ivan; Kasper, Manuel; Ragulskis, Mykolas; Moertelmaier, Manuel; Kienberger, Ferry;
Publié dans: NA, Numéro NA, 2019, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2656124

Data acquisition with a Scanning Microwave Microscope

Auteurs: Buchter, Arne; Le Quang, Toai; Vasyukov, Denis; Hoffmann, Johannes
Publié dans: NA, Numéro NA, 2019, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2656120

Data acquisition with Split - Post Dielectric Resonators

Auteurs: Celuch, Malgorzata; Rudnicki, Janusz; Krupka, Jerzy;
Publié dans: NA, Numéro NA, 2019, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.2673793

"MMAMA_Newsletter#3-Oct 2019"

Auteurs: Philippe Lenain, Gilles Dambrine
Publié dans: 2019
Éditeur: NA
DOI: 10.5281/zenodo.3539502

Open Access CAD, EM tools, and examples for teaching microwaves

Auteurs: Marzena Olszewska-Placha, Malgorzata Celuch, Toai Le Quang, Arif Can Gungor, Johannes Hoffmann, Jasmin Smajic, Janusz Rudnicki
Publié dans: 2020 23rd International Microwave and Radar Conference (MIKON), 2020, Page(s) 402-406, ISBN 978-83-949421-7-5
Éditeur: IEEE
DOI: 10.23919/mikon48703.2020.9253775

Portable Low-Cost Measurement Setup for 2D Imaging of Organic Semiconductors

Auteurs: Malgorzata Celuch, Olivier Douheret, Przemyslaw Korpas, Ryszard Michnowski, Marzena Olszewska-Placha, Janusz Rudnicki
Publié dans: 2020 IEEE/MTT-S International Microwave Symposium (IMS), 2020, Page(s) 373-376, ISBN 978-1-7281-6815-9
Éditeur: IEEE
DOI: 10.1109/ims30576.2020.9224053

Building a near-field scanning millimeter-wave microscope integrated in a scanning electron microscope

Auteurs: Polovodov Petr; Haenssler Olaf; Théron Didier; Boyaval Christophe; Eliet Sophie; Dambrine Gilles; Haddadi Kamel
Publié dans: 2019
Éditeur: IEMN
DOI: 10.5281/zenodo.3549373

Fast and accurate extraction of complex permittivity from surface imaging with SPDR scanner and hand-held VNAs

Auteurs: Olga Stec, Marzena Olszewska-Placha, Janusz Rudnicki, Malgorzata Celuch
Publié dans: 2020 23rd International Microwave and Radar Conference (MIKON), Warsaw, Poland, 2020, pp. 181-185,, 2020
Éditeur: IEEE
DOI: 10.23919/mikon48703.2020.9253923

Frequency Limit of the Drift-Diffusion-Model for SemiconductorSimulations and its Transition to the Boltzmann Model

Auteurs: Till Ehrengruber, Arif Can Gungor, Kaja Jentner, Jasmin Smajic, and Juerg Leuthold
Publié dans: 2020, ISBN 978-88-8250-263-8
Éditeur: Zenodo
DOI: 10.5281/zenodo.4309129

Time-domain Coupled Full Maxwell- and Drift-Diffusion-Solver for Simulating Scanning Microwave Microscopy of Semiconductors

Auteurs: A. Gungor, J. Smajic, F. Moro, J. Leuthold
Publié dans: 2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring), 2019, Page(s) 4071-4077, ISBN 978-1-7281-3403-1
Éditeur: IEEE
DOI: 10.1109/piers-spring46901.2019.9017879

S--parameter calibration procedure for multiport microwave imaging systems

Auteurs: Manuel Kasper; Mykolas Ragulskis; Georg Gramse; Ferry Kienberger
Publié dans: 13th European Conference on Antennas and Propagation, EuCAP 2019, http://www.eucap2019.org, Krakow, Poland, March 31-April 5, 2019, Numéro NA, 2019, Page(s) NA
Éditeur: NA
DOI: 10.5281/zenodo.3132479

Efficient Implementation of BOR FDTD Algorithms in the Engineering Design of Reflector Antennas

Auteurs: Marzena Olszewska-Placha; Christophe Granet; Malgorzata Celuch; Maciej Sypniewski
Publié dans: 13th European Conference on Antennas and Propagation, EuCAP 2019, http://www.eucap2019.org, Krakow, Poland, March 31-April 5, 2019, Numéro NA, 2019, Page(s) NA
Éditeur: IEEE
DOI: 10.5281/zenodo.3249858

Effect of Network Analyzer Trace Noise on Dielectric Measurements with an Open-ended Coaxial Probe

Auteurs: M. Ragulskis, A. La Gioia, M. Kasper, I. Alic, M. O'Halloran, E. Porter, F. Kienberger
Publié dans: 12th European Conference on Antennas and Propagation (EuCAP 2018), Numéro NA, 2018, Page(s) 570 (5 pp.)-570 (5 pp.), ISBN 978-1-78561-816-1
Éditeur: Institution of Engineering and Technology
DOI: 10.1049/cp.2018.0929

Accurate analysis of whispering gallery modes in dielectric resonators with BoR FDTD method

Auteurs: Malgorzata Celuch, Wojciech Gwarek
Publié dans: 2018 22nd International Microwave and Radar Conference (MIKON), 2018, Page(s) 302-303, ISBN 978-83-949421-1-3
Éditeur: IEEE
DOI: 10.23919/mikon.2018.8405207

Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions

Auteurs: P. Polovodov, C. Brillard, O. C. Haenssler, C. Boyaval, D. Deresmes, S. Eliet, F. Wang, N. Clement, D. Theron, G. Dambrine, K. Haddadi
Publié dans: 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Numéro NA, 2018, Page(s) 1-4, ISBN 978-1-5386-5204-6
Éditeur: IEEE
DOI: 10.1109/nemo.2018.8503487

Advanced modelling-based methodology for evaluation and design of large reflector antennas for space applications - state-of-the-art and collaborative research perspective

Auteurs: Wojciech Gwarek, Malgorzata Celuch, and Marzena Olszewska-Placha
Publié dans: 39th ESA Antenna Workshop of Multibeam and Reconfigurable Antennas for Space Applications, ESTEC, Nordwijk, NL, October, 2-5, 2018, Numéro NA, 2018, Page(s) NA
Éditeur: NA

Flexible Electromagnetic Modeling of SMM Setups with FE and FDTD Methods

Auteurs: Arif Can Gungor, Malgorzata Celuch, Jasmin Smajic, Marzena Olszewska - Placha, Juerg Leuthold
Publié dans: 2019 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), 2019, Page(s) 1-4, ISBN 978-1-5386-9516-6
Éditeur: IEEE
DOI: 10.1109/nemo.2019.8853672

Modelling - based methodology for downscaling dielectric resonator material measurements of material surfaces

Auteurs: Malgorzata Celuch, Wojciech Gwarek, Andrzej Wieckowski
Publié dans: 2019 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, IEEE NEMO2019, 2019
Éditeur: IEEE

Multiport Vector Network Analyzer Configured in RF Interferometric Mode for Reference Impedance Renormalization

Auteurs: K. Haddadi, E. Okada, K. Daffe, F. Mubarak, D. Theron, G. Dambrine
Publié dans: 2019 IEEE MTT-S International Microwave Symposium (IMS), 2019, Page(s) 1276-1278, ISBN 978-1-7281-1309-8
Éditeur: IEEE
DOI: 10.1109/mwsym.2019.8700783

Enhanced - resolution material imaging with dielectric resonators: a new implicit space - domain technique

Auteurs: Malgorzata Celuch, Wojciech Gwarek, Andrzej Wieckowski
Publié dans: 2019 IEEE MTT-S International Microwave Symposium (IMS), 2019, Page(s) 55-58, ISBN 978-1-7281-1309-8
Éditeur: IEEE
DOI: 10.1109/mwsym.2019.8701021

Application of dielectric resonators to surface impedance measurements of microwave susceptors

Auteurs: Malgorzata Celuch, Janusz Rudnicki, Jerzy Krupka, Wojciech Gwarek
Publié dans: Proceedings 17th International Conference on Microwave and High Frequency Heating, 2019, ISBN 9788-490487198
Éditeur: Universitat Politècnica de València
DOI: 10.4995/ampere2019.2019.9953

Nanoscale Studies at the Early Stage of Water-Induced Degradation of CH 3 NH 3 PbI 3 Perovskite Films Used for Photovoltaic Applications

Auteurs: Jaume Llacer, David Moerman, Olivier Douhéret, Xavier Noirfalise, Claudio Quarti, Roberto Lazzaroni, Didier Théron, Philippe Leclère
Publié dans: ACS Applied Nano Materials, Numéro 3/8, 2020, Page(s) 8268-8277, ISSN 2574-0970
Éditeur: ACS Publications
DOI: 10.1021/acsanm.0c01687

Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p–n junctions

Auteurs: Georg Gramse, Alexander Kölker, Tomáš Škereň, Taylor J. Z. Stock, Gabriel Aeppli, Ferry Kienberger, Andreas Fuhrer, Neil J. Curson
Publié dans: Nature Electronics, 2020, ISSN 2520-1131
Éditeur: Nature Research
DOI: 10.1038/s41928-020-0450-8

Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers

Auteurs: Olivier Douhéret, Didier Théron, David Moerman
Publié dans: Applied Sciences, Numéro 10/22, 2020, Page(s) 8234, ISSN 2076-3417
Éditeur: Applied Sciences - MDPI
DOI: 10.3390/app10228234

Nanoscale dipole dynamics of protein membranes studied by broadband dielectric microscopy

Auteurs: Georg Gramse, Andreas Schönhals, Ferry Kienberger
Publié dans: Nanoscale, Numéro 11/10, 2019, Page(s) 4303-4309, ISSN 2040-3364
Éditeur: Royal Society of Chemistry
DOI: 10.1039/c8nr05880f

Advanced Modelling Techniques for Resonator Based Dielectric and Semiconductor Materials Characterization

Auteurs: Arif Gungor, Marzena Olszewska-Placha, Malgorzata Celuch, Jasmin Smajic, Juerg Leuthold
Publié dans: Appl. Sci. 2020, 10(23), 8533, 2020, ISSN 2076-3417
Éditeur: Applied Sciences - MDPI
DOI: 10.3390/app10238533

Electromagnetic and Semiconductor Modeling of Scanning Microwave Microscopy Setups

Auteurs: Arif Can Gungor, Malgorzata Celuch, Jasmin Smajic, Marzena Olszewska-Placha, Juerg Leuthold
Publié dans: IEEE Journal on Multiscale and Multiphysics Computational Techniques, 2020, ISSN 2379-8793
Éditeur: IEEE
DOI: 10.1109/jmmct.2020.3027908

Nanoscale Charge Accumulation and Its Effect on Carrier Dynamics in Tri-cation Perovskite Structures

Auteurs: David Toth, Bekele Hailegnaw, Filipe Richheimer, Fernando A. Castro, Ferry Kienberger, Markus C. Scharber, Sebastian Wood, Georg Gramse
Publié dans: ACS Applied Materials & Interfaces, Numéro 12/42, 2020, Page(s) 48057-48066, ISSN 1944-8244
Éditeur: American Chemical Society
DOI: 10.1021/acsami.0c10641

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