A Faster Approach to Network Control

Publications

Conference proceedings (5)

Measurement-driven Analysis of an Edge-Assisted Object Recognition System

Author(s): Apostolos Galanopoulos, Victor Valls, George Iosifidis, Douglas J. Leith
Published in: ICC 2020 - 2020 IEEE International Conference on Communications (ICC), 2020, Page(s) 1-7, ISBN 978-1-7281-5089-5
Publisher: IEEE
DOI: 10.1109/icc40277.2020.9149069

Online Network Flow Optimization for Multi-Grade Service Chains

Author(s): Victor Valls, George Iosifidis, Geeth de Mel, Leandros Tassiulas
Published in: IEEE INFOCOM 2020 - IEEE Conference on Computer Communications, 2020, Page(s) 1329-1338, ISBN 978-1-7281-6412-0
Publisher: IEEE
DOI: 10.1109/infocom41043.2020.9155341

Online Convex Optimization with Perturbed Constraints: Optimal Rates against Stronger Benchmarks

Author(s): Victor Valls, George Iosifidis, Douglas Leith, Leandros Tassiulas
Published in: Proceedings of the Twenty Third International Conference on Artificial Intelligence and Statistics, 2020, Page(s) 2885-2895
Publisher: PMLR

Dynamic Scheduling for IoT Analytics at the Edge

Author(s): Apostolos Galanopoulos, Victor Valls, Douglas J. Leith, George Iosifidis
Published in: "2020 IEEE 21st International Symposium on ""A World of Wireless, Mobile and Multimedia Networks"" (WoWMoM)", 2020, Page(s) 157-166, ISBN 978-1-7281-7374-0
Publisher: IEEE
DOI: 10.1109/wowmom49955.2020.00036

Online Distributed Analytics at the Edge with Multiple Service Grades

Author(s): Victor Valls, Geeth de Mel, Heesung Kwon, Leandros Tassiulas
Published in: 2019 IEEE International Conference on Smart Computing (SMARTCOMP), 2019, Page(s) 51-56, ISBN 978-1-7281-1689-1
Publisher: IEEE
DOI: 10.1109/smartcomp.2019.00028

Peer reviewed articles (1)

Birkhoff's Decomposition Revisited: Sparse Scheduling for High-Speed Circuit Switches

Author(s): Victor Valls, George Iosifidis, Leandros Tassiulas
Published in: IEEE/ACM Transactions on Networking, 2021, Page(s) 1-14, ISSN 1063-6692
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tnet.2021.3088327