Spectromicroscopy of interfaces - binary metal layers on silicon

Project Information

Grant agreement ID: FMBI961221

Project closed

Start date 1 December 1996

End date 30 November 1998

Funded under

• Specific research and technological development programme in the field of the training and mobility of researchers, 1994-1998

Total cost € 0,00

EU contribution No data

Coordinated by

Sincrotrone Trieste ScpA
Italy

Objective

This research project is based on the application of a novel and emerging technique in surface science - Scanning Photoemission Microscopy (SPEM) - to investigate lateral variations on the submicron scale in the chemical composition and electronic structure of interfaces. It will be performed on the ESCA Microscopy beamline at the ELETTRA synchrotron radiation facility. The research work will focus on the study of binary metal layers on Si surfaces (ex.: Ag+Au/Si(111)), to explore how lateral inhomogeneities in morphology, electronic structure and Schottky barrier height can be affected by interface growth conditions, such as temperature and exposure to gases. This will provide new insight in the field of metal-semiconductor interfaces.

Fields of science

• natural sciences › physical sciences › optics › microscopy
• natural sciences › chemical sciences › inorganic chemistry › metalloids

Programme(s)

• FP4-TMR - Specific research and technological development programme in the field of the training and mobility of researchers, 1994-1998

Topic(s)

• 0302 - Post-doctoral research training grants
• TP10 - Condensed Matter - Electronic, Magnetic & Superconduct.Properties

Call for proposal

Data not available

Funding Scheme

RGI - Research grants (individual fellowships)

Coordinator

Sincrotrone Trieste ScpA

• EU contribution: No data
• Address: Palazzina E1 Area di Ricerca di Trieste Padriciano 99 ; 34012 Trieste ; Italy
• Total cost: No data

Participants (1)

Not available

Germany

• EU contribution: No data
• Total cost: No data