Objective This research project is based on the application of a novel and emerging technique in surface science - Scanning Photoemission Microscopy (SPEM) - to investigate lateral variations on the submicron scale in the chemical composition and electronic structure of interfaces. It will be performed on the ESCA Microscopy beamline at the ELETTRA synchrotron radiation facility. The research work will focus on the study of binary metal layers on Si surfaces (ex.: Ag+Au/Si(111)), to explore how lateral inhomogeneities in morphology, electronic structure and Schottky barrier height can be affected by interface growth conditions, such as temperature and exposure to gases. This will provide new insight in the field of metal-semiconductor interfaces. Fields of science natural sciencesphysical sciencesopticsmicroscopynatural scienceschemical sciencesinorganic chemistrymetalloids Programme(s) FP4-TMR - Specific research and technological development programme in the field of the training and mobility of researchers, 1994-1998 Topic(s) 0302 - Post-doctoral research training grants TP10 - Condensed Matter - Electronic, Magnetic & Superconduct.Properties Call for proposal Data not available Funding Scheme RGI - Research grants (individual fellowships) Coordinator Sincrotrone Trieste ScpA Address Palazzina e1 area di ricerca di trieste padriciano 99 34012 Trieste Italy See on map EU contribution € 0,00 Participants (1) Sort alphabetically Sort by EU Contribution Expand all Collapse all Not available Germany EU contribution € 0,00 Address See on map
