Electron Energy Loss Spectrometry (EELS) is a powerful method for micro-analysis in the Transmission Electron Microscope (TEM). It excels with a high spatial resolution, higher sensitivity than X-ray techniques and provides information on binding state and crystalline environment of the sample.
Previous attempts to solve one great remaining problem, the intermingling of elastic and inelastic electron scattering, are theoretically and computationally highly demanding and did not lead to generally applicable results. After one year's research I think having found a practicable way to include dynamical diffraction effects in the modelling of inner-shell excitations.
I intend to create a software package for simulation of doubly differential scattering cross sections for various crystals and compare these simulations to experiments. During my work I shall profit from my superviser's B. Jouffrey expertise, the experience and infrastructure accumulated at Ecole Centrale Paris (ECP) and other research laboratories situated in the Ile de France.