Research objectives and content
The general area of metal oxide thin films is of great technological interest due to the potential application as magnetic field sensors, high frequency devices and non volatile computer information storage. I propose to perform detailed studies of colossal magnetoresistance (CMR) thin films by x-ray scattering, neutron scattering and transmission electron microscopy at MPI-MF, ESRF, HASYLAB and ILL. X-ray and neutron reflectivity, truncation rod analysis and grazing incidence diffraction will be used to characterize the interfaces and to study the influence of thermal annealing on the structure, strain and buffer layer and its connection to the large increase of the CMR effect. The expected result is the elucidation of the mechanism which governs CMR phenomena in thin films of manganates and contribute toward a usable low-field magnetoresistance system.
Training content (objective, benefit and expected impact)
The proposed training will allow me to acquire expertise in other materials characterization techniques like TEM and neutron diffraction which are very important tools in my area of research in thin film technology. The stay at MPI-MF will facilitate my retum to Europe after my previous studies in the USA and allow me to become established in my field of research and pursue an academic position in southern Italy. Links with industry / industrial relevance (22)