Objective
Scanning electron microscopy and scanning tunneling microscopy characterization of semiconductors. Research training is offered in characterization of electronic and optical properties of semiconductors by different microscopy and spectroscopy techniques. In particular, problems related to the nature and distribution of defects, electronic levels, electronic recombination properties, luminescence, surface effects etc. are investigated with high spatial resolution. Characterization techniques sometimes referred as Advanced Scanning Electron Microscopy, as Cathodoluminescence and Electron Beam Induced Current will be used and will be complemented by X-ray microanalysis, X-ray diffraction and electrical spectroscopies. Scanning tunneling microscopy and spectroscopy are applied to characterize electronic materials and to perform correlative studies of electron microscopy and tunnelling microscopy. The tunneling spectroscopy methods enable to investigate surface electronic properties as surface band gap or surface density of states. The activity on micro structural characterization of electronic materials by microscopy methods has been carried out in our Department for more than 20 years and local electronic properties of different III-V, II-VI compounds, Si, diamond or High- T_c superconductors have been investigated. The offered training can be of interest to Ph. D. students, involved in studies of semiconductors (bulk, nanocrystals, heterostructures...). Candidates should be post-graduates in Physics, Materials Science, Electronics or equivalent, but not specific experience is required.
Fields of science (EuroSciVoc)
CORDIS classifies projects with EuroSciVoc, a multilingual taxonomy of fields of science, through a semi-automatic process based on NLP techniques. See: The European Science Vocabulary.
CORDIS classifies projects with EuroSciVoc, a multilingual taxonomy of fields of science, through a semi-automatic process based on NLP techniques. See: The European Science Vocabulary.
- natural sciences physical sciences optics microscopy electron microscopy
- natural sciences physical sciences electromagnetism and electronics semiconductivity
- natural sciences physical sciences optics microscopy scanning tunneling microscopy
- natural sciences physical sciences electromagnetism and electronics superconductivity
- natural sciences physical sciences optics spectroscopy
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Programme(s)
Multi-annual funding programmes that define the EU’s priorities for research and innovation.
Multi-annual funding programmes that define the EU’s priorities for research and innovation.
Topic(s)
Calls for proposals are divided into topics. A topic defines a specific subject or area for which applicants can submit proposals. The description of a topic comprises its specific scope and the expected impact of the funded project.
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Calls for proposals are divided into topics. A topic defines a specific subject or area for which applicants can submit proposals. The description of a topic comprises its specific scope and the expected impact of the funded project.
Call for proposal
Procedure for inviting applicants to submit project proposals, with the aim of receiving EU funding.
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Procedure for inviting applicants to submit project proposals, with the aim of receiving EU funding.
Funding Scheme
Funding scheme (or “Type of Action”) inside a programme with common features. It specifies: the scope of what is funded; the reimbursement rate; specific evaluation criteria to qualify for funding; and the use of simplified forms of costs like lump sums.
Funding scheme (or “Type of Action”) inside a programme with common features. It specifies: the scope of what is funded; the reimbursement rate; specific evaluation criteria to qualify for funding; and the use of simplified forms of costs like lump sums.
Coordinator
28040 MADRID
Spain
The total costs incurred by this organisation to participate in the project, including direct and indirect costs. This amount is a subset of the overall project budget.