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Study of Emission Spectroscopy on Laser Produced Plasma for Localized Multielement Analysis in Solids with Surface Imaging


The aim of this project is to develop a prototype instrumentation for multielement mapping in situ at atmospheric pressure based upon the measurement of the optical emission from a laser ablation produced plasma. In principle the new prototype will be applicable to conducting and non-conducting materials and will be capable of routine measurements for the control of industrial materials.

To this end, first a prototype for localized quantitative multielement detection will be constructed fulfilling the following specifications:

- the spot of microplasma shall be adjustable between 5 and 15 mm;
- the lateral resolution shall be better than 10 mm;
- the sensitivity for metallic elements shall permit the detection of a concentration superior than 1% compared to the matrix;
- the relative accuracy shall be better than 10% for a microplasma diameter of 5 microns.

To demonstrate the expected sensitivity and resolution a wide range of materials will be studied. In the event of a poor sensitivity or efficiency of the instrument, additional measures for improvement will be tested. Once the feasibility of the method of localized elemental analysis has been proved, the subsequent step will be the development of a prototype that can be used for imaging. The characteristics of the imaging assembly will be as follows:

- chemical mapping of surface shall be in the order of 1 mm{2};
- the relative resolution and the sensitivity shall be the same as for the local detection.


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Call for proposal

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Commissariat à l'Energie Atomique (CEA)
EU contribution
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Centre d'Etudes de Saclay
91191 Gif-sur-Yvette

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Participants (8)