The quantification of surface analytical AES and XPS was the subject of several earlier projects. As such, they are effective if the peak height is not influenced by the matrix. When interference is present, one needs improved methods for substracting the background from the actual spectra.
Improved methods are now available in the form of practical algorithms. The aim of the proposed project is to test the application of these algorithms, initially with pure metals and then with increasingly complex materials, both homogeneous and non-homogeneous. At each stage, the application of the new methods will be revised in the light of the results.
The work will be initially carried out by XPS. It will be extended to AES in a later phase.
An intercomparison on the use of the new background subtraction algorithms in comparison to existing ones is being carried out for data produced on a wide range of makes and models of XPS instruments.