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Stress Technology X-Ray Industrial Analyser

Objective



The proposed research project aims to design and create a miniature X-ray diffraction device so as to measure residual stresses in materials. This device will be portable and suitable for industrial exploitation conditions. Research is required :
- to improve the performance of the existing technologies (interms of rapidity, resolution, repeatability and reproductibility),
- to allow the development of a miniaturised device, which will achieve measurementswhatever the geometry and size of the mechanical controlled parts. The projectwill take into account some of the application conditions for each industrialsector of users.

Funding Scheme

EAW - Exploratory awards

Coordinator

Sonats S.A.
Address
1,Rue Ile Macé
44406 Reze
France

Participants (1)

STRESSTECH OY
Finland
Address
Tikkutehtaantie 1
Vaajakoski