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Content archived on 2024-04-15

NON-DESTRUCTIVE SURFACE AND THIN FILM ANALYSIS BY LOW-ENERGY EMISSION SPECTROSCOPY

Objective


Low energy electron induced X-ray spectrocopy (LEEIXS) has been established as a qualitative method for surface film analysis in the nanometre range. At a more specific level, the work has resulted in the mutually beneficial exchange of X-ray spectroscopic experience, computer software for data analysis and analytical equipment.

Topic(s)

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Call for proposal

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Coordinator

Queen Mary and Westfield College
EU contribution
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Address
Mile End Road
E1 4NS London
United Kingdom

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Participants (1)