Quantum Metrology in Applications

Publications

Peer reviewed articles (4)

Ultimate Precision Limits for Noisy Frequency Estimation

Author(s): Andrea Smirne, Jan Kołodyński, Susana F. Huelga, Rafał Demkowicz-Dobrzański
Published in: Physical Review Letters, 116/12, 2016, ISSN 0031-9007
Publisher: American Physical Society
DOI: 10.1103/PhysRevLett.116.120801

Improved Quantum Magnetometry beyond the Standard Quantum Limit

Author(s): J. B. Brask, R. Chaves, J. Kołodyński
Published in: Physical Review X, 5/3, 2015, ISSN 2160-3308
Publisher: American Physical Society
DOI: 10.1103/PhysRevX.5.031010

Random Bosonic States for Robust Quantum Metrology

Author(s): M. Oszmaniec, R. Augusiak, C. Gogolin, J. Kołodyński, A. Acín, M. Lewenstein
Published in: Physical Review X, 6/4, 2016, ISSN 2160-3308
Publisher: American Physical Society
DOI: 10.1103/PhysRevX.6.041044

Asymptotic role of entanglement in quantum metrology

Author(s): R. Augusiak, J. Kołodyński, A. Streltsov, M. N. Bera, A. Acín, M. Lewenstein
Published in: Physical Review A, 94/1, 2016, ISSN 2469-9926
Publisher: American Physical Society
DOI: 10.1103/PhysRevA.94.012339

Other (1)

Quantum metrology with full and fast quantum control

Author(s): P. Sekatski, M. Skotiniotis, J. Kołodyński, W. Dür
Published in: 2016
Publisher: arXiv