Development of a New Wavelength Scanning Interferometer for Embedded Metrology

Información del proyecto

EMInstr

Identificador del acuerdo de subvención: 665589

DOI 10.3030/665589

Proyecto cerrado

Fecha de la firma de la CE 11 Marzo 2015

Fecha de inicio 1 Abril 2015

Fecha de finalización 31 Marzo 2016

Financiado con arreglo a

• EXCELLENT SCIENCE - European Research Council (ERC)

Coste total € 149 662,00

Aportación de la UE € 149 662,00

Coordinado por

UNIVERSITY OF HUDDERSFIELD
United Kingdom

Publicaciones

Conference proceedings (5)

In-situ defect detection systems for R2R flexible PV barrier films

Autores: Gao, Feng, Muhamedsalih, Hussam, Tang, Dawei, Elrawemi, Mohamed, Blunt, Liam, Jiang, Xiang, Edge, Steven, Bird, David and Hollis, Philip
Publicado en: International Conference on Optical Instrument and Technology, 2015
Editor: SPIE

A computerised data handling procedure for defect detection and analysis for large area substrates manufactured by roll-to-roll process

Autores: Muhamedsalih, H., Elrawemi, M., Blunt, L., Xiangqi, L. and Martin, H. (
Publicado en: Laser Metrology and Machine Performance XI, LAMDAMAP 2015, 2015
Editor: EUSPEN

Extending the vertical range of wavelength scanning interferometry

Autores: Moschetti, G., Muhamedsalih, H., Jiang, X., Leach, R. and O'Connor, D.
Publicado en: ASPE 2015 Summer Topical Meeting, 2015, ISBN 978-1-887706-68-1
Editor: American Society for Precision Engineering

An integrated opto-mechanical measurement system for in-process defect measurement on a roll-to-roll process

Autores: Muhamedsalih, H., Blunt, L., Martin, H., Hamersma, I., Elrawemi, M. and Feng, G.
Publicado en: Laser Metrology and Machine Performance XI, LAMDAMAP, 2015, Página(s) 50-55, ISBN 978-0-9566790-5-5
Editor: EUSPEN

Vertical axis non-linearities in wavelength scanning interferometry

Autores: Moschetti, G., Muhamedsalih, H., Connor, D., Jiang, X. and Leach, R.
Publicado en: Laser Metrology and Machine Performance XI, LAMDAMAP 2015, 2015, Página(s) 31-39, ISBN 978-0-9566790-5-5
Editor: EUSPEN

Peer reviewed articles (2)

Phase and fringe order determination in wavelength scanning interferometry

Autores: Giuseppe Moschetti, Alistair Forbes, Richard K Leach, Xiang Jiang, Daniel O’Connor
Publicado en: Optics Express, Edición 24/8, 2016, Página(s) 8997, ISSN 1094-4087
Editor: Optical Society of America
DOI: 10.1364/OE.24.008997

Burg algorithm for enhancing measurement performance in wavelength scanning interferometry

Autores: Rebecca Woodcock, Hussam Muhamedsalih, Haydn Martin, Xiangqian Jiang
Publicado en: Surface Topography: Metrology and Properties, Edición 4/2, 2016, Página(s) 024003, ISSN 2051-672X
Editor: IOP Publishing Ltd
DOI: 10.1088/2051-672X/4/2/024003

Derechos de propiedad intelectual

Other (1)

SURFACE CHARACTERISTIC DETERMINING APPARATUS

Número de solicitud/publicación: WO 201082066
Fecha: 2010-01-15
Solicitante(s): UNIVERSITY OF HUDDERSFIELD