X-ray optics and microanalysis

The fifteenth international conference on X-ray optics and microanalysis, will be held in Antwerp, Belgium, from 24 to 27 August 1998. The aim of the event is to discuss the latest developments in methods and instrumentation for micro and surface analysis, as well as advances in applications.

The conference will highlight problems concerned with the validation of microscopial techniques and will deal with both the quantitative aspects of electron microprobe analysis, as well as qualitative aspects of the methodologies considered. The following topics will be covered in detail:

- Quantitative aspects of microanalysis;
- Synchrotron radiation and X-ray optics for microanalysis;
- Micro and surface analysis;
- Thin film analysis and TEM;
- Applications in materials science, art and archaeometry, chemical and biological investigations and earth sciences.
For further information, please contact:

Universiteit Antwerpen
Professor F. Adams
Departement Scheikunde
1 Universiteitsplein
B-2610 Antwerpen
Tel. +32-3-8202010; Fax +32-3-8202376
E-mail: adams@uia.ua.ac.be