CLERECO at DATE17
27 March 2017 - 31 March 2017
Lausanne, Switzerland
Celebrating its 20th edition, the DATE (Design, Automation and Test in Europe) conference will have an especially remarkable technical programme, again addressing all aspects of research into technologies for electronic and embedded system engineering.
The FP7 CLERECO project will be exhibiting at the conference. It is developing a framework for efficient reliability evaluation and therefore efficient exploitation of reliability oriented design approaches. This will start from the early phases of the design process that will enable circuit integration to continue at exponential rates, and enable the design and manufacture of future systems for the computing continuum.
For further information, please see:
DATE2017 conference website(opens in new window)
Dedicated CLERECO conference page(opens in new window)
The FP7 CLERECO project will be exhibiting at the conference. It is developing a framework for efficient reliability evaluation and therefore efficient exploitation of reliability oriented design approaches. This will start from the early phases of the design process that will enable circuit integration to continue at exponential rates, and enable the design and manufacture of future systems for the computing continuum.
For further information, please see:
DATE2017 conference website(opens in new window)
Dedicated CLERECO conference page(opens in new window)