RADiation facility Network for the EXploration of effects for indusTry and research

Project Information

RADNEXT

Grant agreement ID: 101008126

DOI

10.3030/101008126

EC signature date 12 March 2021

Start date 1 June 2021

End date 31 May 2026

Funded under

• EXCELLENT SCIENCE - Research Infrastructures

Total cost

€ 4 999 999,75

EU contribution

€ 4 999 999,75

Coordinated by

ORGANISATION EUROPEENNE POUR LA RECHERCHE NUCLEAIRE
Switzerland

CORDIS provides links to public deliverables and publications of HORIZON projects.

Links to deliverables and publications from FP7 projects, as well as links to some specific result types such as dataset and software, are dynamically retrieved from OpenAIRE .

Deliverables

Documents, reports (13)

Recommendation for simulating low energy protons

This deliverable will summarize the calculations of low energy protons by comparing direct and indirect ionization. It will investigate how to consider both mechanisms when evaluating the initial nuclear reaction in a device. The effect on single event effect cross section will be estimated for different technologies.

Definition and Standardization of the basic requirements for Pass/fail test of systems

This report will summarize the outcomes of Task6.3 concerning the basic requirements to run the test of systems targeting the knowledge of the level of resilience of the whole systems to target radiation levels.

Published list of tested components against cumulative effects

This report will summarize all the experimental data obtained in this WP (TNID and TID), including possible technological trends identified in the scope of the work.

Intermediate report on the coordination of Communication, Dissemination, Exploitation and training

This document will provide an intermediate overview of communications, dissemination, events, exploitation initiatives and the training module development.

Comparison of X-ray / cobalt experimental data

This report will summarize the experimental results of the Sub-Tasks7.2.1 and Sub-Tasks7.2.2 on X-ray and Cobalt irradiation on components and systems.

Updated international irradiation facility compendium

Updated international irradiation facility compendium, with respect to the presently available RADECS 2015 compendium, and including an online interface.

Modelling of the X-ray generator and of the Co60 source

This deliverable will provide information on how to model the radiation environment of the XRay generator and the Co60 source used for irradiating devices The spectrum of particles in this facilities will be calculated at different location thanks to the FLUKA Monte Carlo tool

Report on the solutions to overcome the technological and accessibility limits for present facilities, including analysis on virtual and remote irradiation access

Partially linked to D4.1, this report will focus on technological and accessibility bottlenecks for present facilities, addressing specifically an analysis on solutions for virtual and remote access to irradiation facilities.

Communication and dissemination plan

This document will include a list of communication channels including website social media etc and the approach to gather input and keep track of previous communications It will also include a plan for dissemination of results based on publications in journals presentation at conferences and science fairs The plan will also consider the approach for outreach to the broader audience Also the planning for internal communication within the consortium will be described

Exploitation and data management plan

This document will describe the internal research data management approach as well as the procedure for exploitation of the research results from the collaboration including the IP aspects patenting options and the link with publications

Simulation results of the importance of 1-10MeV energy range on the SER for neutrons

This report will summarize the main results of the simulations of low energy neutronsIt will investigate nuclear cross sections the secondary particles at play and the expected impact on the soft error rate

Report on key performance parameters and limiting factors for current facilities

This deliverable will consist of a report on key performance parameters and limiting factors for current facilities in view of future technological bottlenecks, with a dedicated section for LPA facilities. Recommendations will be provided on how to improve the key performance indicators, and overcome the identified limitations.

Simulation results and report on circuit modelling

This deliverable will investigate the way it is possible to consider a simple model for SEU cross section evaluation at transistor level. Different circuits will be investigate (INVERTER, NAND, NOR, SRAM). The comparison for two technology nodes will be presented for each circuit.

Publications

Conference proceedings (6)

Effects of High-Energy Protons on a Self-Refresh DRAM

Author(s): Lucas Matana Luza; Carolina Imianosky; André Martins Pio de Mattos; Douglas Almeida dos Santos; Daniel Söderström; Luigi Dilillo
Published in: HAL-LIRMM, Issue 11, 2022
Publisher: IEEE
DOI: 10.5281/zenodo.7541199

Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring

Author(s): Slipukhin, Ivan; Coronetti, Andrea; García Alía, Rubén; Saigné, Frédéric; Boch, Jérôme; Dilillo, Luigi; Aguiar, Ygor; Cazzaniga, Carlo; Kastrioto, Maria; Dodd, Torran
Published in: Issue 33, 2023
Publisher: HAL Open Science
DOI: 10.5281/zenodo.13255632

Fragmented high-energy heavy ion beams for electronics testing

Author(s): García Alía, Rubén; Bilko, Kacper; Cerutti, Francesco; Coronetti, Andrea; Emriskova, Natalia; Esposito, Luigi; Salvat Pujol, Francesc; Waets, Andreas; Girard, Sylvain; Saigné, Frédéric; Durante, Marco; Schuy, Christoph; Wagner, Tim
Published in: Issue 2, 2022
Publisher: IEEE
DOI: 10.5281/zenodo.6833637

Single Event Upsets under Proton, Thermal and Fast Neutron Irradiation in Emerging Nonvolatile Memories

Author(s): Golnaz Korkian, Daniel León, Francisco J. Franco, Juan C. Fabero, Manon Letiche, Yolanda Morilla, Pedro Martín-Holgado, Helmut Puchner, Hortensia Mecha, Juan A. Clemente
Published in: 2022
Publisher: IEEE
DOI: 10.1109/access.2022.3217527

Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices

Author(s): Lucas Matana Luza; Frederic Wrobel; Luis Entrena; Luigi Dilillo
Published in: IEEE Xplore, Issue 20, 2022, ISBN 978-1-6654-6706-3
Publisher: IEEE
DOI: 10.1109/ETS54262.2022.9810454

Debugging Xilinx Zynq-7000 SoC Processor Caches during Linux System Execution under Proton Irradiation

Author(s): M. Jaksch; J. Budroweit; F. Stehle
Published in: IEEE Xplore, Issue 18, 2022, ISBN 978-1-6654-8857-0
Publisher: IEEE
DOI: 10.1109/REDW56037.2022.9921631

Peer reviewed articles (11)

Comparison of High Energy X-ray and Cobalt 60 irradiations on MOS capacitors

Author(s): Vincent Girones, Jérôme Boch, Frédéric Saigné, Alain Carapelle, Arnaud Chapon, Tadec Maraine, Rubén García Alía
Published in: IEEE Transactions on Nuclear Science, 2024, Page(s) 1-1, ISSN 0018-9499
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3366432

The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices

Author(s): Vincent Girones, Jérôme Boch, Alain Carapelle, Arnaud Chapon, Tadec Maraine, Timothee Labau, Frédéric Saigné, Rubén García Alía
Published in: IEEE Transactions on Nuclear Science, Issue 70, 2023, Page(s) 1982-1989, ISSN 0018-9499
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2023.3279626

An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons

Author(s): Frédéric Wrobel, Ygor Aguiar, Cleiton Marques, Giuseppe Lerner, Rubén García Alía, Frédéric Saigné, Jérôme Boch
Published in: Electronics, Issue 12, 2022, Page(s) 104, ISSN 2079-9292
Publisher: Electronics MDPI
DOI: 10.3390/electronics12010104

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Author(s): Douglas A. Santos; André M. P. Mattos; Lucas M. Luza; Carlo Cazzaniga; Maria Kastriotou; Douglas R. Melo; Luigi Dilillo
Published in: IEEE Xplore, Issue 8, 2022, ISSN 2765-933X
Publisher: IEEE
DOI: 10.1109/DFT56152.2022.9962335

Gamma Ray Effects on Multi-Colored Commercial Light-Emitting Diodes at MGy Level

Author(s): Luca Weninger, Raphaël Clerc, Matteo Ferrari, Adriana Morana, Timothé Allanche, Roberto Pecorella, Aziz Boukenter, Youcef Ouerdane, Emmanuel Marin, Olivier Duhamel, Marc Gaillardin, Philippe Paillet, Sylvain Girard
Published in: Electronics, Issue 12, 2022, Page(s) 81, ISSN 2079-9292
Publisher: Electronics MDPI
DOI: 10.3390/electronics12010081

A Methodology to Estimate Single-Event Effects Induced by Low-Energy Protons

Author(s): Cleiton Marques, Frédéric Wrobel, Ygor Aguiar, Alain Michez, Jérôme Boch, Frédéric Saigné, Rubén García Alía
Published in: Eng, Issue 5, 2024, Page(s) 319-332, ISSN 2673-4117
Publisher: Eng MDPI
DOI: 10.3390/eng5010017

Distributed Optical Fiber-Based Radiation Detection Using an Ultra-Low-Loss Optical Fiber

Author(s): Luca Weninger, Adriana Morana, Youcef Ouerdane, Emmanuel Marin, Aziz Boukenter, Sylvain Girard
Published in: Radiation, Issue 4, 2024, Page(s) 167-182, ISSN 2673-592X
Publisher: MDPI
DOI: 10.3390/radiation4020013

Radiation Monitoring with Radiosensitive Pure-Silica Core Ultra-Low Loss Optical Fiber

Author(s): Luca Weninger, Adriana Morana, Cosimo Campanella, Jeoffray Vidalot, Emmanuel Marin, Youcef Ouerdane, Aziz Boukenter, Rubén García Alía, Sylvain Girard
Published in: IEEE Transactions on Nuclear Science, 2024, Page(s) 1-1, ISSN 0018-9499
Publisher: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3380999

Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip

Author(s): Douglas A. Santos, André M. P. Mattos, Douglas R. Melo, Luigi Dilillo
Published in: Electronics, Issue 12, 2023, Page(s) 2557, ISSN 2079-9292
Publisher: Electronics MDPI
DOI: 10.3390/electronics12122557

Neutron-induced effects on a self-refresh DRAM

Author(s): Lucas Matana Luza, Daniel Söderström, Helmut Puchner, Rubén García Alía, Manon Letiche, Carlo Cazzaniga, Alberto Bosio, Luigi Dilillo
Published in: Microelectronics Reliability, Issue 128, 2022, Page(s) 114406, ISSN 0026-2714
Publisher: Elsevier BV
DOI: 10.1016/j.microrel.2021.114406

Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells

Author(s): Cleiton M. Marques, Frédéric Wrobel, Ygor Q. Aguiar, Alain Michez, Frédéric Saigné, Jérôme Boch, Luigi Dilillo, Rubén García Alía
Published in: Electronics, Issue 13, 2024, Page(s) 1954, ISSN 2079-9292
Publisher: Electronics
DOI: 10.3390/electronics13101954