RADiation facility Network for the EXploration of effects for indusTry and research

CORDIS oferuje możliwość skorzystania z odnośników do publicznie dostępnych publikacji i rezultatów projektów realizowanych w ramach programów ramowych HORYZONT.

Odnośniki do rezultatów i publikacji związanych z poszczególnymi projektami 7PR, a także odnośniki do niektórych konkretnych kategorii wyników, takich jak zbiory danych i oprogramowanie, są dynamicznie pobierane z systemu OpenAIRE .

Rezultaty

Recommendation for simulating low energy protons

This deliverable will summarize the calculations of low energy protons by comparing direct and indirect ionization. It will investigate how to consider both mechanisms when evaluating the initial nuclear reaction in a device. The effect on single event effect cross section will be estimated for different technologies.

Definition and Standardization of the basic requirements for Pass/fail test of systems

This report will summarize the outcomes of Task6.3 concerning the basic requirements to run the test of systems targeting the knowledge of the level of resilience of the whole systems to target radiation levels.

Published list of tested components against cumulative effects

This report will summarize all the experimental data obtained in this WP (TNID and TID), including possible technological trends identified in the scope of the work.

Intermediate report on the coordination of Communication, Dissemination, Exploitation and training

This document will provide an intermediate overview of communications, dissemination, events, exploitation initiatives and the training module development.

Comparison of X-ray / cobalt experimental data

This report will summarize the experimental results of the Sub-Tasks7.2.1 and Sub-Tasks7.2.2 on X-ray and Cobalt irradiation on components and systems.

Updated international irradiation facility compendium

Updated international irradiation facility compendium, with respect to the presently available RADECS 2015 compendium, and including an online interface.

Modelling of the X-ray generator and of the Co60 source

This deliverable will provide information on how to model the radiation environment of the X-Ray generator and the Co60 source used for irradiating devices. The spectrum of particles in this facilities will be calculated at different location thanks to the FLUKA Monte Carlo tool.

Report on the solutions to overcome the technological and accessibility limits for present facilities, including analysis on virtual and remote irradiation access

Partially linked to D4.1, this report will focus on technological and accessibility bottlenecks for present facilities, addressing specifically an analysis on solutions for virtual and remote access to irradiation facilities.

Communication and dissemination plan

This document will include a list of communication channels including website, social media, etc. and the approach to gather input and keep track of previous communications It will also include a plan for dissemination of results based on publications in journals, presentation at conferences and science fairs. The plan will also consider the approach for outreach to the broader audience. Also, the planning for internal communication within the consortium will be described.

Exploitation and data management plan

This document will describe the internal research data management approach as well as the procedure for exploitation of the research results from the collaboration including the IP aspects, patenting options and the link with publications.

Simulation results of the importance of 1-10MeV energy range on the SER for neutrons

This report will summarize the main results of the simulations of low energy neutrons.It will investigate nuclear cross sections, the secondary particles at play and the expected impact on the soft error rate.

Report on key performance parameters and limiting factors for current facilities

This deliverable will consist of a report on key performance parameters and limiting factors for current facilities in view of future technological bottlenecks, with a dedicated section for LPA facilities. Recommendations will be provided on how to improve the key performance indicators, and overcome the identified limitations.

Simulation results and report on circuit modelling

This deliverable will investigate the way it is possible to consider a simple model for SEU cross section evaluation at transistor level. Different circuits will be investigate (INVERTER, NAND, NOR, SRAM). The comparison for two technology nodes will be presented for each circuit.

Publikacje

Calibration of the Deposited Energy in CMOS Imagers for Particle Detection on Nanosatellites

Autorzy: Josua Florczak, Tom Neubert, Egon Zimmermann, Heinz Rongen, Martin Kaufmann, Ingo Rienäcker, Wojciech Hajdas, Martin Riese, Stefan Van Waasen
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2023, Strona(/y) 1966-1972, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2023.3274876

Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring

Autorzy: Ivan Slipukhin, Andrea Coronetti, Rubén García Alía, Frédéric Saigné, Jérôme Boch, Luigi Dilillo, Ygor Q. Aguiar, Carlo Cazzaniga, Maria Kastriotou, Torran Dodd
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 71, 2024, Strona(/y) 1948-1955, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3424201

Physical Explanation for the Higher Sensitivity to Ion-Induced Burnout in SiC Schottky Diodes Compared to Si Schottky Diodes

Autorzy: C. M. Marques, A. Michez, F. Wrobel, S. Kuboyama, F. Saigné, L. Dilillo, Y. Q. Aguiar, R. G. Alía
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 72, 2025, Strona(/y) 2411-2418, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2025.3561917

SEU Cross-Section Estimation Using ECORCE TCAD Tool

Autorzy: Cleiton M. Marques, Alain Michez, Frédéric Wrobel, Ygor Q. Aguiar, Frédéric Saigné, Luigi Dilillo, Rubén García Alía
Opublikowane w: Electronics, Numer 14, 2025, Strona(/y) 2997, ISSN 2079-9292
Wydawca: MDPI AG
DOI: 10.3390/electronics14152997

Heavy Ion Energy Deposition and SEE Intercomparison Within the RADNEXT Irradiation Facility Network

Autorzy: Rubén García Alía, Andrea Coronetti, Kacper Bilko, Matteo Cecchetto, Gerd Datzmann, Salvatore Fiore, Sylvain Girard
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2023, Strona(/y) 1596-1605, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2023.3260309

Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories Onboard PROBA-V

Autorzy: André M. P. Mattos, Douglas A. Santos, Lucas M. Luza, Viyas Gupta, Thomas Borel, Luigi Dilillo
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 71, 2024, Strona(/y) 1614-1622, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3378668

Fragmented High-Energy Heavy-Ion Beams for Electronics Testing

Autorzy: Rubén García Alía, Kacper Bilko, Francesco Cerutti, Andrea Coronetti, Natalia Emriskova, Luigi Esposito, Francesc Salvat Pujol, Andreas Waets, Sylvain Girard, Frédéric Saigné, Marco Durante, Christoph Schuy, Tim Wagner
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2024, Strona(/y) 486-495, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2022.3210403

Evaluating Reduced Resolution Redundancy for Radiation Hardening in FPGA Designs

Autorzy: Luis A. García-Astudillo, Almudena Lindoso, Luis Entrena, Honorio Martín, Mario García-Valderas, Pedro Martín-Holgado, Yolanda Morilla
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2023, Strona(/y) 2060-2067, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2023.3268825

Proton Dosimetry Using Radiation-Induced Luminescence in Micrometer-Core Germanosilicate Optical Fibers

Autorzy: Camille Bélanger-Champagne, Fiammetta Fricano, Adriana Morana, Damien Lambert, Crystal Penner, Philippe Paillet, Michael Trinczek, Samuel Usherovich, Sylvain Girard, Cornelia Hoehr
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2023, Strona(/y) 1666-1672, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2023.3243565

Comparison of High Energy X-ray and Cobalt 60 irradiations on MOS capacitors

Autorzy: Vincent Girones, Jérôme Boch, Frédéric Saigné, Alain Carapelle, Arnaud Chapon, Tadec Maraine, Rubén García Alía
Opublikowane w: IEEE Transactions on Nuclear Science, 2024, Strona(/y) 1-1, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3366432

The Use of High-Energy X-Ray Generators for TID Testing of Electronic Devices

Autorzy: Vincent Girones, Jérôme Boch, Alain Carapelle, Arnaud Chapon, Tadec Maraine, Timothee Labau, Frédéric Saigné, Rubén García Alía
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2023, Strona(/y) 1982-1989, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2023.3279626

Characterization of Single-Event Effects in a Microcontroller with an Artificial Neural Network Accelerator

Autorzy: Carolina Imianosky, André M. P. Mattos, Douglas A. Santos, Douglas R. Melo, Maria Kastriotou, Carlo Cazzaniga, Luigi Dilillo
Opublikowane w: Electronics, Numer 13, 2025, Strona(/y) 4461, ISSN 2079-9292
Wydawca: MDPI AG
DOI: 10.3390/electronics13224461

An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons

Autorzy: Frédéric Wrobel, Ygor Aguiar, Cleiton Marques, Giuseppe Lerner, Rubén García Alía, Frédéric Saigné, Jérôme Boch
Opublikowane w: Electronics, Numer 12, 2022, Strona(/y) 104, ISSN 2079-9292
Wydawca: Electronics MDPI
DOI: 10.3390/electronics12010104

Evaluating Fault-Tolerant Techniques on COTS RISC-V NOEL-V Processor in Zynq UltraScale+ FPGA Under Proton Testing

Autorzy: Ádria Barros de Oliveira, Fernanda Lima Kastensmidt
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2023, Strona(/y) 1708-1715, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2023.3281396

Potential of radioluminescent silica-based optical fibers for 14 MeV neutron beam monitoring

Autorzy: Luca Weninger, Adriana Morana, Andrea Colangeli, Fiammetta Fricano, Youcef Ouerdane, Emmanuel Marin, Aziz Boukenter, Stefano Loreti, Antonino Pietropaolo, Sylvain Girard
Opublikowane w: Results in Optics, Numer 19, 2025, Strona(/y) 100807, ISSN 2666-9501
Wydawca: Elsevier BV
DOI: 10.1016/j.rio.2025.100807

Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring

Autorzy: André M. P. Mattos, Douglas A. Santos, Lucas M. Luza, Viyas Gupta, Luigi Dilillo
Opublikowane w: Electronics, Numer 13, 2025, Strona(/y) 1822, ISSN 2079-9292
Wydawca: MDPI AG
DOI: 10.3390/electronics13101822

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Autorzy: Douglas A. Santos; André M. P. Mattos; Lucas M. Luza; Carlo Cazzaniga; Maria Kastriotou; Douglas R. Melo; Luigi Dilillo
Opublikowane w: IEEE Xplore, Numer 8, 2022, ISSN 2765-933X
Wydawca: IEEE
DOI: 10.1109/DFT56152.2022.9962335

Fast neutron response characterization of an EJ-276 plastic scintillator for use as a neutron monitor

Autorzy: Khai D. Ngo, Carlo Cazzaniga, Michela Paoletti, Davide Rigamonti, Maria Kastriotou, Christopher Frost, Marco Tardocchi, Jeff Sykora, Sarah Mann, Benjamin Lutz, Ralf Nolte
Opublikowane w: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Numer 1051, 2025, Strona(/y) 168216, ISSN 0168-9002
Wydawca: Elsevier BV
DOI: 10.1016/j.nima.2023.168216

Gamma Ray Effects on Multi-Colored Commercial Light-Emitting Diodes at MGy Level

Autorzy: Luca Weninger, Raphaël Clerc, Matteo Ferrari, Adriana Morana, Timothé Allanche, Roberto Pecorella, Aziz Boukenter, Youcef Ouerdane, Emmanuel Marin, Olivier Duhamel, Marc Gaillardin, Philippe Paillet, Sylvain Girard
Opublikowane w: Electronics, Numer 12, 2022, Strona(/y) 81, ISSN 2079-9292
Wydawca: Electronics MDPI
DOI: 10.3390/electronics12010081

Evaluation of a Robust System for Hyperspectral Data Compression Under Neutron and Proton Effects

Autorzy: Luis Entrena, Antonio J. Sánchez, Mario García-Valderas, Yubal Barrios, Roberto Sarmiento, Almudena Lindoso
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 72, 2025, Strona(/y) 2727-2734, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2025.3549601

Standard instrumentation for single-event effect qualification of systems-on-chip: a robust, low-cost, and open-source proposal

Autorzy: André M. P. Mattos, Mauricio R. Alas, Douglas A. Santos, Luigi Dilillo
Opublikowane w: Journal of Instrumentation, Numer 20, 2025, Strona(/y) P06009, ISSN 1748-0221
Wydawca: Institute of Physics
DOI: 10.1088/1748-0221/20/06/p06009

Calibration in the Visible and Infrared Domains of Multimode Phosphosilicate Optical Fibers for Dosimetry Applications

Autorzy: Luca Weninger, Cosimo Campanella, Adriana Morana, Fiammetta Fricano, Emmanuel Marin, Youcef Ouerdane, Aziz Boukenter, Rubén García Alía, Sylvain Girard
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2023, Strona(/y) 1908-1916, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2023.3252941

Radiation Reliability of System Reboots in Commercial Off-the-Shelf SoC

Autorzy: Lester Frias-Dominguez, German Leon, Jose M. Badia, Jose A. Belloch, Mario Garcia-Valderas, Almudena Lindoso, Luis Entrena
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 72, 2025, Strona(/y) 2662-2670, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2025.3539942

Single Event Effects in 3-D NAND Flash Memory Cells With Replacement Gate Technology

Autorzy: Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Alessandra Costantino, Véronique Ferlet-Cavrois, Anastasia Pesce, Silvia Beltrami
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2024, Strona(/y) 308-313, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2022.3223763

Pre-Irradiation Influence on Proton Radioluminescence Responses of Sol-Gel Optical Fibers

Autorzy: F. Fricano, A. Morana, C. Hoehr, C. Campanella, C. Bélanger-Champagne, M. Trinczek, D. Lambert, P. Paillet, H. El Hamzaoui, B. Capoen, M. Bouazaoui, A. Boukenter, E. Marin, Y. Ouerdane, S. Girard
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 72, 2025, Strona(/y) 2059-2065, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2025.3553065

Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-On-Chip

Autorzy: Douglas A. Santos, Pablo M. Aviles, André M. P. Mattos, Mario García-Valderas, Luis Entrena, Almudena Lindoso, Luigi Dilillo
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 71, 2025, Strona(/y) 1722-1730, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3406021

A Methodology to Estimate Single-Event Effects Induced by Low-Energy Protons

Autorzy: Cleiton Marques, Frédéric Wrobel, Ygor Aguiar, Alain Michez, Jérôme Boch, Frédéric Saigné, Rubén García Alía
Opublikowane w: Eng, Numer 5, 2024, Strona(/y) 319-332, ISSN 2673-4117
Wydawca: Eng MDPI
DOI: 10.3390/eng5010017

Impact of Tier Pitch Scaling on Heavy-Ion Sensitivity of 3-D NAND Flash Memories

Autorzy: Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Augusto Benvenuti, Silvia Beltrami
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 71, 2025, Strona(/y) 1731-1737, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3355939

Reconstruction of the GANIL-NFS spectral neutron flux with Medley using elastically scattered protons

Autorzy: L. de Arruda, D. Tarrío, X. Ledoux, S. Pomp, D. Ramos, A. V. Prokofiev, U. Tippawan, A. Al-Adili, M. Ansorge, D. Fernández, I. Ipatova, I. Kodeli, M. Lantz, J. Novák, E. Pirovano, H. Sengar, T. Tanaka, A. Cobo
Opublikowane w: EPJ Web of Conferences, Numer 322, 2025, Strona(/y) 08006, ISSN 2100-014X
Wydawca: EDP Sciences
DOI: 10.1051/epjconf/202532208006

Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs

Autorzy: Daniel Söderström, Lucas Matana Luza, André Martins Pio de Mattos, Thierry Gil, Heikki Kettunen, Kimmo Niskanen, Arto Javanainen, Luigi Dilillo
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 70, 2023, Strona(/y) 1861-1869, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2023.3295435

Distributed Optical Fiber-Based Radiation Detection Using an Ultra-Low-Loss Optical Fiber

Autorzy: Luca Weninger, Adriana Morana, Youcef Ouerdane, Emmanuel Marin, Aziz Boukenter, Sylvain Girard
Opublikowane w: Radiation, Numer 4, 2024, Strona(/y) 167-182, ISSN 2673-592X
Wydawca: MDPI
DOI: 10.3390/radiation4020013

14-MeV and Atmospheric Neutron Monitoring Through Optical Fiber Dosimeters

Autorzy: M. Roche, D. Lambert, L. Weninger, A. Morana, N. Kerboub, C. Bélanger-Champagne, A. Colangeli, C. Hoehr, M. Trinczek, E. Marin, A. Boukenter, Y. Ouerdane, P. Paillet, J. Mekki, T. Robin, S. Girard
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 72, 2025, Strona(/y) 1137-1144, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3521506

Radiation Monitoring with Radiosensitive Pure-Silica Core Ultra-Low Loss Optical Fiber

Autorzy: Luca Weninger, Adriana Morana, Cosimo Campanella, Jeoffray Vidalot, Emmanuel Marin, Youcef Ouerdane, Aziz Boukenter, Rubén García Alía, Sylvain Girard
Opublikowane w: IEEE Transactions on Nuclear Science, 2024, Strona(/y) 1-1, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3380999

Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip

Autorzy: Douglas A. Santos, André M. P. Mattos, Douglas R. Melo, Luigi Dilillo
Opublikowane w: Electronics, Numer 12, 2023, Strona(/y) 2557, ISSN 2079-9292
Wydawca: Electronics MDPI
DOI: 10.3390/electronics12122557

Neutron-induced effects on a self-refresh DRAM

Autorzy: Lucas Matana Luza, Daniel Söderström, Helmut Puchner, Rubén García Alía, Manon Letiche, Carlo Cazzaniga, Alberto Bosio, Luigi Dilillo
Opublikowane w: Microelectronics Reliability, Numer 128, 2022, Strona(/y) 114406, ISSN 0026-2714
Wydawca: Elsevier BV
DOI: 10.1016/j.microrel.2021.114406

Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells

Autorzy: Cleiton M. Marques, Frédéric Wrobel, Ygor Q. Aguiar, Alain Michez, Frédéric Saigné, Jérôme Boch, Luigi Dilillo, Rubén García Alía
Opublikowane w: Electronics, Numer 13, 2024, Strona(/y) 1954, ISSN 2079-9292
Wydawca: Electronics
DOI: 10.3390/electronics13101954

Enhancing Performance of Optical Fiber-Based Sensor for Proton Dosimetry Through Pre-Irradiation Treatment

Autorzy: F. Fricano, A. Morana, C. Hoehr, C. Campanella, C. Bélanger-Champagne, M. Trinczek, G. Mélin, T. Robin, D. Lambert, A. Boukenter, E. Marin, Y. Ouerdane, P. Paillet, S. Girard
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 73, 2026, Strona(/y) 1063-1068, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2025.3625255

Reliability of Vision Transformers and CNNs on Edge AI Systems Under Neutron Radiation

Autorzy: Jose M. Badia, Ignacio Martin-Salinas, German Leon, Adrian Amor-Martin, Lester Frias-Dominguez, Jose A. Belloch, Mario Garcia-Valderas, Almudena Lindoso, Carlo Cazzaniga, Luis Entrena
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 72, 2026, Strona(/y) 2706-2716, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2025.3536519

System-Level Total Ionizing Dose Testing of Satellite Subsystems: EagleEye Microsatellite Case Study

Autorzy: Tomasz Rajkowski, Przemysław Pustułka, Marcin Bieda, Sylwia Ślasa, Michał Kazaniecki, Kamil Myszka, Mateusz Szczygielski, Jarosław Iwaszkiewicz, Konrad Traczyk, Kamil Tarenko, Adam Hołownia, Michał Ładno, Piotr Bińczyk, Szymon Wasilewski, Marcin Mazur, Tomasz Zawistowski, Sławosz Uznański, Tymoteusz Kosiński, Mariusz Chabera, Krzysztof Mazurek, Jan Klimaszewski, Adam Wasilewski, Micha
Opublikowane w: Electronics, Numer 13, 2025, Strona(/y) 122, ISSN 2079-9292
Wydawca: MDPI AG
DOI: 10.3390/electronics13010122

Very High Dose Rate Proton Dosimetry With Radioluminescent Silica-Based Optical Fibers

Autorzy: F. Fricano, A. Morana, D. Lambert, C. Hoehr, C. Campanella, C. Bélanger-Champagne, M. Trinczek, H. El Hamzaoui, B. Capoen, A. Cassez, M. Bouazaoui, G. Mélin, T. Robin, A. Boukenter, E. Marin, Y. Ouerdane, P. Paillet, S. Girard
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 71, 2024, Strona(/y) 1829-1836, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3378803

Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons

Autorzy: André M. P. Mattos, Douglas A. Santos, Luigi Dilillo
Opublikowane w: IEEE Access, Numer 13, 2025, Strona(/y) 19922-19936, ISSN 2169-3536
Wydawca: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/access.2024.3524726

Total-Dose-Induced Threshold Voltage Shift Dependence on Tier Pitch in 3-D nand Flash Memories

Autorzy: Marta Bagatin, Silvia Beltrami, Alessandro Paccagnella, Simone Gerardin
Opublikowane w: IEEE Transactions on Nuclear Science, Numer 72, 2025, Strona(/y) 1237-1242, ISSN 0018-9499
Wydawca: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tns.2024.3506787

Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments

Autorzy: Douglas A. Santos, André M. P. Mattos, Douglas R. Melo, Luigi Dilillo
Opublikowane w: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023, Strona(/y) 1-6
Wydawca: IEEE
DOI: 10.1109/dft59622.2023.10313549

Effects of High-Energy Protons on a Self-Refresh DRAM

Autorzy: Lucas Matana Luza; Carolina Imianosky; André Martins Pio de Mattos; Douglas Almeida dos Santos; Daniel Söderström; Luigi Dilillo
Opublikowane w: HAL-LIRMM, Numer 11, 2022
Wydawca: IEEE
DOI: 10.5281/zenodo.7541199

Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring

Autorzy: Slipukhin, Ivan; Coronetti, Andrea; García Alía, Rubén; Saigné, Frédéric; Boch, Jérôme; Dilillo, Luigi; Aguiar, Ygor; Cazzaniga, Carlo; Kastrioto, Maria; Dodd, Torran
Opublikowane w: Numer 33, 2023
Wydawca: HAL Open Science
DOI: 10.5281/zenodo.13255632

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures

Autorzy: Cleiton M. Marques, Leonardo H. Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. C. Bartra, Paulo F. Butzen, Cristina Meinhardt
Opublikowane w: 2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI), 2023, Strona(/y) 1-6
Wydawca: IEEE
DOI: 10.1109/sbcci60457.2023.10261665

Spatial Profile of a Very High-Energy <sup>208</sup> Pb Heavy Ion Beam at CHARM

Autorzy: Andreas Pflaum, Markus Lapp, Björn Poppe, Andreas Waets, Natalia Emriskova, Eliott Philippe Johnson, Rubén García Alía, Hui Khee Looe, Vanessa Wyrwoll
Opublikowane w: 2024 24th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2025, Strona(/y) 1-6
Wydawca: IEEE
DOI: 10.1109/radecs61970.2024.11298564

Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments

Autorzy: André M. P. Mattos, Douglas A. Santos, Carolina Imianosky, Douglas R. Melo, Luigi Dilillo
Opublikowane w: 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI), 2023, Strona(/y) 227-232
Wydawca: IEEE
DOI: 10.1109/iwasi58316.2023.10164578

Fragmented high-energy heavy ion beams for electronics testing

Autorzy: García Alía, Rubén; Bilko, Kacper; Cerutti, Francesco; Coronetti, Andrea; Emriskova, Natalia; Esposito, Luigi; Salvat Pujol, Francesc; Waets, Andreas; Girard, Sylvain; Saigné, Frédéric; Durante, Marco; Schuy, Christoph; Wagner, Tim
Opublikowane w: Numer 2, 2022
Wydawca: IEEE
DOI: 10.5281/zenodo.6833637

Heavy Ion Induced SEU and MBU Sensitivity of 3D NAND Flash Structures

Autorzy: L. Coïc, G. Augustin, L. Serrano, J. Guillermin, N. Chatry, J. Carron, R. Ecoffet
Opublikowane w: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2024, Strona(/y) 1-8
Wydawca: IEEE
DOI: 10.1109/radecs55911.2022.10412481

External Quantum Efficiency Evolution of Light-Emitting Diodes under γ-rays, Electrons, Neutrons and Protons

Autorzy: Luca Weninger, Adriana Morana, Matteo Ferrari, Aziz Boukenter, Youcef Ouerdane, Emmanuel Marin, Philippe Paillet, Marc Gaillardin, Olivier Duhamel, Cornelia Hoehr, Camille Bélanger-Champagne, Michael Trinczek, Sylvain Girard
Opublikowane w: 2024 24th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2025, Strona(/y) 1-9
Wydawca: IEEE
DOI: 10.1109/radecs61970.2024.11298608

Comparative of proton radiation data for 28 nm Zynq-7000 SoC

Autorzy: P. M. Aviles, L. A García-Astudillo, J.A. Belloch, L. Entrena, A. Lindoso
Opublikowane w: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2024, Strona(/y) 1-4
Wydawca: IEEE
DOI: 10.1109/radecs55911.2022.10412445

Single Event Upsets under Proton, Thermal and Fast Neutron Irradiation in Emerging Nonvolatile Memories

Autorzy: Golnaz Korkian, Daniel León, Francisco J. Franco, Juan C. Fabero, Manon Letiche, Yolanda Morilla, Pedro Martín-Holgado, Helmut Puchner, Hortensia Mecha, Juan A. Clemente
Opublikowane w: 2022
Wydawca: IEEE
DOI: 10.1109/access.2022.3217527

Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices

Autorzy: Lucas Matana Luza; Frederic Wrobel; Luis Entrena; Luigi Dilillo
Opublikowane w: IEEE Xplore, Numer 20, 2022, ISBN 978-1-6654-6706-3
Wydawca: IEEE
DOI: 10.1109/ETS54262.2022.9810454

IRRAD/CHARM, a CERN Irradiation Facility for Accelerator and Experiments Radiation Hardness Qualification

Autorzy: P. Pelissou, S. Danzeca, D. Bozzato, F. Ravotti, R. Froeschl, S. Fiore, J. Lendaro, B. Gkotse, J. Szumega, G. Pezzullo
Opublikowane w: 2024 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2024 NSREC), 2025, Strona(/y) 1-6
Wydawca: IEEE
DOI: 10.1109/redw61286.2024.10759157

Debugging Xilinx Zynq-7000 SoC Processor Caches during Linux System Execution under Proton Irradiation

Autorzy: M. Jaksch; J. Budroweit; F. Stehle
Opublikowane w: IEEE Xplore, Numer 18, 2022, ISBN 978-1-6654-8857-0
Wydawca: IEEE
DOI: 10.1109/REDW56037.2022.9921631

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