Large area interferometric imager for highly sensitive inspection of materials

Project description

Novel light interference harnesses the strength in diversity

Interference is generally a term that brings negative connotations to mind. However, interference patterns caused by merging two or more types of waves from the electromagnetic spectrum can be quite valuable. Interferometers harnessing this principle are used in many fields of science and engineering when trying to get a closer look at the composition of materials. The EU-funded LIM project is bringing to market an advanced large-area interferometric imager. Its ability to characterise materials samples down to a few atomic layers of sensitivity, combined with its potential compact size, could revolutionise in-line inspection in critical areas including semiconductors and photonics.

Fields of science

• engineering and technology › electrical engineering, electronic engineering, information engineering › electronic engineering › sensors › optical sensors
• natural sciences › physical sciences › optics › microscopy › super resolution microscopy
• natural sciences › physical sciences › quantum physics › quantum optics

Programme(s)

• H2020-EU.1.2. - EXCELLENT SCIENCE - Future and Emerging Technologies (FET) Main Programme
• H2020-EU.1.2.1. - FET Open

Topic(s)

• FETOPEN-03-2018-2019-2020 - FET Innovation Launchpad

Call for proposal

H2020-FETOPEN-2018-2020

See other projects for this call

Sub call

H2020-FETOPEN-2018-2019-2020-4

Funding Scheme

CSA-LSP - Coordination and support action Lump sum

Coordinator

FUNDACIO INSTITUT DE CIENCIES FOTONIQUES

Net EU contribution

€ 100 000,00

Address

Avinguda Carl Friedrich Gauss 3
08860 Castelldefels
Spain

Region

Este › Cataluña › Barcelona

Activity type

Research Organisations

Links

Other funding

No data