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Large area interferometric imager for highly sensitive inspection of materials

Project description

Novel light interference harnesses the strength in diversity

Interference is generally a term that brings negative connotations to mind. However, interference patterns caused by merging two or more types of waves from the electromagnetic spectrum can be quite valuable. Interferometers harnessing this principle are used in many fields of science and engineering when trying to get a closer look at the composition of materials. The EU-funded LIM project is bringing to market an advanced large-area interferometric imager. Its ability to characterise materials samples down to a few atomic layers of sensitivity, combined with its potential compact size, could revolutionise in-line inspection in critical areas including semiconductors and photonics.

Call for proposal

H2020-FETOPEN-2018-2020

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Sub call

H2020-FETOPEN-2018-2019-2020-4

Coordinator

FUNDACIO INSTITUT DE CIENCIES FOTONIQUES
Net EU contribution
€ 100 000,00
Address
Avinguda Carl Friedrich Gauss 3
08860 Castelldefels
Spain

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Region
Este Cataluña Barcelona
Activity type
Research Organisations
Other funding
No data