Project description
Quantum-enhanced measurements in metrology
It is possible to limit statistical error in metrology and sensing by using quantum systems. These quantum systems can reach the Heisenberg limit, which is proportional to 1/N for measurements. However, applying quantum standards and sensors is challenging due to their intrinsic incompatibility of their working conditions. The EU-funded FLATS project proposes to use twisted bilayer graphene as a multi-phenomenon platform to develop electrical quantum metrology standards that can work under compatible conditions. It will also create a new generation of metrological sensors that go beyond the International System of units. The common platform will enable the establishment of a single multi-use on-chip quantum lab. The results will be the first step toward quantum-enhanced measurements for metrological applications.
Objective
The ultimate limit on the accuracy of any measurement is set by quantum mechanics, this also means that quantum effects can be used in metrology and sensing to go well beyond any classical approach. For classical systems, statistical error is proportional to 1/sqrt(N) with N the number of measured particles. Measurements in quantum systems can overcome this limit and reach the Heisenberg limit proportional to 1/N. However, quantum standards and sensors are challenging to put in practice and their working conditions are nowadays intrinsically incompatible (e.g. magnetic field and superconductivity). Therefore, limiting their reach in terms of users and their development as accurate and enhanced quantum technologies.
The vision we propose in FLATS is to use twisted bilayer graphene as a multiphenomena platform to develop present electrical quantum metrology standards, working under compatible conditions, and to develop the new generation of metrological sensor, going beyond the International System of units (SI). Their common platform will allow their integration as a single multi-use on-chip quantum lab.
To achieve this, we will first create a European twistronics plateform for an unprecedented control of the relative angular alignment between graphene/BN layers. We will develop novel and original quantum electrical standards with twisted heterostructures. Our on-chip metrological quantum lab also enables the implementation of metrological sensors beyond the SI. This will be the first step towards quantum-enhanced measurements for metrological applications.
Fields of science
- engineering and technologynanotechnologynano-materialstwo-dimensional nanostructuresgraphene
- natural sciencesphysical sciencesquantum physics
- engineering and technologyelectrical engineering, electronic engineering, information engineeringelectronic engineeringsensors
- natural sciencesphysical scienceselectromagnetism and electronicssuperconductivity
Programme(s)
- HORIZON.3.1 - The European Innovation Council (EIC) Main Programme
Funding Scheme
HORIZON-EIC - HORIZON EIC GrantsCoordinator
75015 PARIS 15
France