Description du projet
Des mesures améliorées par les quanta en métrologie
Il est possible de limiter l’erreur statistique en métrologie et en détection en utilisant des systèmes quantiques. Ces systèmes quantiques peuvent atteindre la limite d’Heisenberg, qui est proportionnelle à 1/N pour les mesures. Cependant, l’application d’étalons et de capteurs quantiques est complexe en raison de l’incompatibilité intrinsèque de leurs conditions de travail. Le projet FLATS, financé par l’UE, propose d’utiliser le graphène bicouche torsadé comme plateforme multiphénomène pour développer des normes de métrologie quantique électrique pouvant fonctionner dans des conditions compatibles. Il créera également une nouvelle génération de capteurs métrologiques allant au-delà du Système international d’unités. La plateforme commune permettra la mise en place d’un laboratoire quantique sur puce unique à usage multiple. Les résultats constitueront la première étape vers des mesures améliorées par les quanta pour des applications métrologiques.
Objectif
The ultimate limit on the accuracy of any measurement is set by quantum mechanics, this also means that quantum effects can be used in metrology and sensing to go well beyond any classical approach. For classical systems, statistical error is proportional to 1/sqrt(N) with N the number of measured particles. Measurements in quantum systems can overcome this limit and reach the Heisenberg limit proportional to 1/N. However, quantum standards and sensors are challenging to put in practice and their working conditions are nowadays intrinsically incompatible (e.g. magnetic field and superconductivity). Therefore, limiting their reach in terms of users and their development as accurate and enhanced quantum technologies.
The vision we propose in FLATS is to use twisted bilayer graphene as a multiphenomena platform to develop present electrical quantum metrology standards, working under compatible conditions, and to develop the new generation of metrological sensor, going beyond the International System of units (SI). Their common platform will allow their integration as a single multi-use on-chip quantum lab.
To achieve this, we will first create a European twistronics plateform for an unprecedented control of the relative angular alignment between graphene/BN layers. We will develop novel and original quantum electrical standards with twisted heterostructures. Our on-chip metrological quantum lab also enables the implementation of metrological sensors beyond the SI. This will be the first step towards quantum-enhanced measurements for metrological applications.
Champ scientifique
- engineering and technologynanotechnologynano-materialstwo-dimensional nanostructuresgraphene
- natural sciencesphysical sciencesquantum physics
- engineering and technologyelectrical engineering, electronic engineering, information engineeringelectronic engineeringsensors
- natural sciencesphysical scienceselectromagnetism and electronicssuperconductivity
Programme(s)
- HORIZON.3.1 - The European Innovation Council (EIC) Main Programme
Régime de financement
HORIZON-EIC - HORIZON EIC GrantsCoordinateur
75015 PARIS 15
France