3D/4D imaging of complex and deformed microstructures with pink-beam dark field X-ray microscopy
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Autores:
Can Yildirim, Aditya Shukla, Yubin Zhang, Nikolas Mavrikakis, Louis Lesage, Virginia Sanna, Marilyn Sarkis, Yaozhu Li, Michela La Bella, Carsten Detlefs, Henning Friis Poulsen
Publicado en:
Communications Materials, Edición 6, 2025, ISSN 2662-4443
Editor:
Springer Science and Business Media LLC
DOI:
10.1038/S43246-025-00926-9
Quantifying resolution in pink-beam dark-field X-ray microscopy: experiments and simulations
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Autores:
M. La Bella, H.F. Poulsen, S. Staeck, N.A. Henningsson, M.P. Kabukcuoglu, C. Detlefs and C. Yildirim
Publicado en:
Journal of Applied Crystallography, 2026, ISSN 1600-5767
Editor:
international union of crystallography (iucr)
DOI:
10.1107/S1600576726005200
Deep learning-assisted weak beam identification in Dark-field X-ray microscopy
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Autores:
A. Benhadjira, C. Detlefs, S. Borgi, V. Favre-Nicolin, C. Yildirim
Publicado en:
npj Computational Materials, 2026, ISSN 2057-3960
Editor:
Springer Science and Business Media LLC
DOI:
10.1038/S41524-026-02127-5
Advances in artificial intelligence-based approaches to enhance dark field X-ray microscopy analysis
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Autores:
Brinthan Kanesalingam, Can Yildirim, Leora Dresselhaus-Marais
Publicado en:
MRS Communications, 2025, ISSN 2159-6867
Editor:
Springer Science and Business Media LLC
DOI:
10.1557/S43579-025-00860-4
A high-temperature furnace for multimodal synchrotron-based X-ray microscopy and diffraction imaging
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Autores:
Louis Lesage, Yves Watier, Helena Isern, Aditya Shukla, Virginia Sanna, Thomas Dufrane, Yubin Zhang, Carsten Detlefs, Can Yıldırım
Publicado en:
Journal of Synchrotron Radiation, Edición 33, 2026, ISSN 1600-5775
Editor:
International Union of Crystallography (IUCr)
DOI:
10.1107/S1600577525010288
New perspectives on materials and device dynamics using time-resolved full-field diffraction X-ray imaging
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Autores:
Can Yildirim, Tobias U. Schulli, Tao Zhou, Leora Dresselhaus-Marais, Paul G. Evans
Publicado en:
Current Opinion in Solid State and Materials Science, Edición 44, 2026, ISSN 1359-0286
Editor:
Elsevier BV
DOI:
10.1016/J.COSSMS.2026.101280