This experiment concerns productivity in the development and continuous engineering of embedded SW for products like instruments and apparatus within the professional instruments area, telecommunication area, and home electronics area.
A common challenge to the whole European apparatus industry is time to market versus control of embedded SW complexity in coping with users demand for advanced functionality, communication features, and unique quality.
The application experiment shall verify the possibility of increasing both productivity and SW quality by combination of a SA/SD-RT methodology and a state/transition based methodology with automatic logical check functions and direct code generation. The objective is not to verify the benefits of each methodologies used alone but to use them fully integrated in order to obtain the benefits from both methodologies and from the synergy of the integration.
The two methodologies are both well known as state of the art and as best practice with benefits in specification/design phase and implementation/maintenance phase respectively. The two methodologies are usually applied separately.
A European Consortium of 3 embedded SW developers and 1 consultancy company is established in order to evaluate the application experiment and participate in the exploitation phase. A link to two suppliers is established.