This project aims to develop test strategies for mixed-signal/radio-frequency (RF) integrated devices using machine learning. The proposed efforts will be directed to two main areas, namely (a) the on-line test of mixed-signal/RF circuits when they are embedded in a System-on-Chip (SoC) or a System-in-Package (SiP) that demands high reliability and (b) the testing of RF micro-electro-mechanical systems (MEMS). The key novelty of this interdisciplinary project lies in the amalgamation of concepts from machine learning with state-of-the-art practices in very large-scale integration (VLSI) design and test, in order to address emerging and open-ended test challenges.
Fields of science
Call for proposal
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