Objective
- To reduce test time in electromigration tests targeting low current 0.1 mA/cm{2}, more appropriate to real life, and to perform very accurate measurement of resistance degradation at a very accurately held temperature (sigma = 0.0085 °C) to obtain credible results in about 10 days, and low costs per DuT (Device under Test).
- To establish a new standard for electromigration testing with reduced test time using in-situ degradation monitoring, opening up a whole new family of reliability systems using the same principles.
The assessment of the DESTIN electromigration test system will be carried out by three semiconductor manufacturers. Normally high currents have been used to speed up electromigration test results but correlation with real-time results is poor. Here the approach is very accurate measurement of degradation resistance changed at low stress currents to give better correlation with real-time.
Fields of science (EuroSciVoc)
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CORDIS classifies projects with EuroSciVoc, a multilingual taxonomy of fields of science, through a semi-automatic process based on NLP techniques.
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Call for proposal
Data not availableFunding Scheme
ACM - Preparatory, accompanying and support measuresCoordinator
9700 Oudenaarde
Belgium