Deliverables
Report on the round robin results with data collection about different water gas barrier measurements and correlation between and water and helium gas barrier measurements
Specification report of the testing conditions for the water round robin testing
Final public report
Publications
Author(s): H. Fledderus; H. B. Akkerman; A. Salem; N. Friedrich Schilling; U. Klotzbach
Published in: 2017
Author(s): A.Kacprowicz
Published in: 2017
Author(s): S. Cros, A. Salem, H. B. Akkerman, B. Leupolt, W. Grählert
Published in: 2017
Author(s): H. Fledderus, H. B. Akkerman, A. Salem, N. Friedrich-Schilling, J. Rabe, M. Anderson, T. Kuntze,
U. Klotzbach
Published in: 2017
Author(s): C. Uhrich, A. Weiß, M. Pfeiffer
Published in: 2017
Author(s): S. P. Banerjee et al.
Published in: 2017
Author(s): S. P. Banerjee, M. Sentis
Published in: 2017
Author(s): U. Klotzbach, T. Kuntze, P. Wollmann, H. Fledderus
Published in: 2017
Author(s): S. P. Banerjee, M. Sentis
Published in: 2017
Author(s): K. Walzer
Published in: 2017
Author(s): S. P. Banerjee, S. Cros, M. Sentis
Published in: 2017
Author(s): W. Grählert, B. Leupolt, H. Beese, S. Cros
Published in: 2017
Author(s): N. Friedrich-Schilling, H. Fledderus, F. Peuckert, T. Kuntze, B. Gburek, A. Salem, H. B. Akkerman, M. Anderson
Published in: 2017
Author(s): J. Rabe, N. Friedrich-Schilling
Published in: 2017
Author(s): Christian L. Uhrich, Martin Pfeiffer, Andre Weiß
Published in: Organic, Hybrid, and Perovskite Photovoltaics XVIII, 2017, Page(s) 11
DOI: 10.1117/12.2273833
Author(s): H. Fledderus, H. B. Akkerman, A. Salem, N. Friedrich Schilling, U. Klotzbach
Published in: Laser-based Micro- and Nanoprocessing XI, 2017, Page(s) 100920I
DOI: 10.1117/12.2248533
Author(s): Thomas Kuntze, Philipp Wollmann, Udo Klotzbach, Henri Fledderus
Published in: Laser-based Micro- and Nanoprocessing XI, 2017, Page(s) 100920J
DOI: 10.1117/12.2255934
Author(s): A. Salem et al.
Published in: 2017
Author(s): W. Grählert (Fraunhofer IWS)
Published in: 2016
Author(s): U. Klotzbach (Fraunhofer IWS)
Published in: 2016
Author(s): V. Franke, T. Kuntze (Fraunhofer IWS)
Published in: 2016
Author(s): A. Salem (Holst Centre / TNO)
Published in: 2016
Author(s): R. Wichtendahl et al. (Heliatek GmbH)
Published in: 2016
Author(s): S. Cros (CEA)
Published in: 2016
Author(s): J. Rabe (Heliatek GmbH)
Published in: 2016
Author(s): S. Cros (CEA)
Published in: 2015
Author(s): M. Pfeiffer et al. (Heliatek GmbH)
Published in: 2016
Author(s): M. Grimm (3D-Micromac AG)
Published in: 2015
Author(s): S. P. Banerjee et al. (CNRS)
Published in: 2016
Author(s): H. Fledderus (Holst Centre / TNO)
Published in: 2016
Author(s): S. P. Banerjee et al. (CNRS)
Published in: 2016
Author(s): S. P. Banerjee et. al (CNRS)
Published in: 2016
Author(s): H. B. Akkermann (Holst Centre/TNO)
Published in: 2015
Author(s): K. Walzer (Heliatek GmbH)
Published in: 2015
Author(s): U. Klotzbach (Fraunhofer IWS)
Published in: 2015
Author(s): H. B. Akkermann (Holst Centre /TNO)
Published in: 2015
Author(s): N. Friedrich-Schilling (Fraunhofer IWS)
Published in: 2015
Author(s): W. Grählert (Fraunhofer IWS)
Published in: 2015
Author(s): H. B. Akkermann (Holst Centre/TNO)
Published in: 2015
Author(s): S.P. Banerjee, Thierry Sarnet, Panayiotis Siozos, Michalis Loulakis, Demetrios Anglos, Marc Sentis
Published in: Applied Surface Science, 2016, ISSN 0169-4332
DOI: 10.1016/j.apsusc.2016.11.136
Author(s): B. Gutknecht (Sorter)
Published in: 2016
Author(s): M. Sentis (CNRS)
Published in: 2015