Periodic Reporting for period 2 - SPM2.0 (Scanning probe microscopies for nanoscale fast, tomographic and composition imaging)
Période du rapport: 2019-01-01 au 2020-12-31
Nanotechnology has emerged in recent years as a technology able to manipulate matter at a very small scale within the nanometer range (from one to one hundred nanometers). This technology offers potential applications in areas such as Electronics, Biology, Medicine, and Materials Science. The research and manufacture of Nanotechnology based products depend strongly on the development of Advanced Microscopy techniques, which outsource the limited spatial resolution of conventional Optical Microscopy. At present, the greatest challenges include the realization of fast images with a nanoscale spatial resolution to monitor the dynamics of nanoscale processes, the realization of nanoscale images of the inside of the materials in a non-destructive way (nanotomography), and the realization of nanoscale images sensitive to the chemical composition with sub-10 nm spatial resolution. Scanning Probe Microscopy is the Advanced Microscopy technique experiencing the fastest evolution and innovation towards solving these challenges. The objective of the SPM2.0 European Training Network was to train a new generation of researchers in the science and technology of these novel Scanning Probe Microscopies (SPM2.0) in which Europe is currently in a leading position. The Network aimed at enforcing its development and its quick and wide commercialization and implementation in the public and private sectors, including metrology institutions. The fellows of the network were expected to acquire a solid state-of-the-art multidisciplinary scientific training in SPM2.0 microscopy techniques, covering from basic science to industrial applications, and to generate new scientific and technological knowledge on them to promote its further evolution. They were also expected to receive training on transferable skills in order to increase their employability perspectives and to qualify them to access responsible job positions in the private and public sectors. The final aim of the network was to consolidate Europe as the world leader in Scanning Probe Microscopy technologies, promoting its application in the development of Nanotechnology based products in key sectors like Materials, Microelectronics, Biology, and Medicine.
The first actions consisted in setting up the management and board structure of the SPM2.0 network (done at the Kickoff meeting in January 2017) and in the recruitment of the 14 early stage researchers (ESR), following an open and transparent recruitment procedure (23 applicants per position on the average). Of the selected ESRs 5 were women (around 36%). All fellows enrolled in a Doctoral Program at a University. Six Training Workshops have been organized, one every half a year starting in January 2018. The last training workshop took place online due to the COVID19 emergency. All fellows attended all training workshops. A total of 11 scientific courses have been organized, providing a wide and common scientific and technological background on SPM2.0 technologies and their emerging fields of application. In addition, 8 courses on transversal skills were organized to increase the employability perspectives of the fellows. A Personal Carrier Development Plan was elaborated for each fellow, which contained the ensemble of research objectives and training actions to be undertaken. In the last year, a Personal Employability Plan was elaborated for each fellow to explore employment opportunities in the private and public sectors. Training took place also through secondments, of which a total of 47 months has been implemented. Research activities have advanced following the scheduled plan and with the main active contribution of the ESRs. Theoretical advances have been made for the interpretation of mechanical, electrical, and optical measurements made with scanning probe microscopes for nanoscale composition mapping. Moreover, the basis for nanotomography reconstruction based on the electrical properties has been set-up. Instruments to map the composition at the nanoscale based on mechanical, electrical, optical, and chemical recognition measurements have been developed. Also, instrumental advances to retrieve information from below the surface of the samples (nanotomography) have been achieved. Novel probes for high-speed imaging and molecular recognition mapping have been developed, as well as, a temperature control system for high-speed atomic force microscopy. Applications of these developments to polymer science, organic electronics, solar cell technology, biology, and drug delivery have been developed. Finally, a metrological analysis of the best practices in the calibration of the spring constant of atomic force microscopy probes and of the tip-sample interaction area has been issued. The scientific results gave rise to 20 scientific publications, and to 65 communications to national and international conferences (36 oral communications and 29 posters). Dissemination for the public was made through the project webpage, which also constituted the main tool for internal communication, and through a Linkedin account. In addition, three newsletters and three application notes have been issued, as well as a video game for kids. Five Network meetings were organized, with the attendance of all fellows, beneficiaries, and project managers. At the meetings, the evolution of the project was reviewed and the alignment of the consortium towards the objectives of the project for the next year was setup. In the meetings, the ESRs presented their scientific and training progress and met with their assessment commissions.
The theoretical and instrumental methods developed to perform the compositional mapping of materials at the nanoscale based on the mechanical, electrical, optical, and molecular recognition properties of the materials are well-beyond the state of the art. Such methods point towards an advanced and automatic quantitative interpretation of scanning probe microscopy images for nanoscale composition mapping, which was not available before the start of the project. Such methods could open to non-experts the possibility to perform multiparametric composition analysis of samples at the nanoscale, thus greatly facilitating its introduction and wide dissemination within the scientific community and in the industrial sector to facilitate the production of nanotechnology-based products. Also, the development of specific probes for high-speed atomic force microscopy and molecular recognition imaging are well beyond the state of the art. They are expected to broaden the capabilities of an emerging technology like high-speed atomic force microscopy, which is promising to revolutionize the visualization and study of the dynamics of processes at the nanoscale, specifically in Molecular Biology. Concerning the report on good practices in probe calibration for atomic force microscopy, it contains valuable information obtained from advanced scanning probe microscopy developers and users belonging to the network, which could contribute to the standardization of this procedure, which still has not been achieved within the scanning probe microscopy community. Standardization is a critical requirement for industrial applications of scanning probe microscopy techniques. Therefore, these developments could contribute to the adoption of the SPM2.0 microscopy techniques by the industry.