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Nanoscale self-assembled epitaxial nucleation controlled by interference lithography

Deliverables

Website and Project logo established

Establishment of project public website, with project details and partner information. To include final project logo

Laser prototype 2

Demonstration of 2nd laser prototype (IN) to meet required specifications

Laser interference structuring system assembly

Images and data from assembled laser interference capabilities on system reactors and initial experiments

Laser Prototype 1

Demonstration of 1st laser prototype (IN) to meet required specifications

Laser interference structuring system implementation plan

Report detailing the implementation plan for the installation of laser interference systems on the various process reactors

Self-assembled InGaAs QD array

Demonstration of state or the art nanostructring results for QD arrays as defined in the project text (including structural, optical and device data)

Report on nanostructuring routes and potential capabilities

Report describing process routes to advanced nanostructring and assessment of capabilities

Laser interference structuring Implementation report

Report describing progress in the assembly and operation of process systems and the resulting nanostructuring of materials surfaces

Model of surface interactions

Report or publication describing the approaches used for the modelling of pulsed interference laser patterns on process surfaces and their results

Interim report on laser interference surface processes

Report on the scientific study of interactions of process surfaces with pulsed laser interference

NanoStencil public workshop

Organisation of an open international workshop for the dissemination of results, comparison with worldwide state of the art and discussion of exploitation routes

Searching for OpenAIRE data...

Publications

Thermodynamic Processes on a Semiconductor Surface during In-Situ Multi-Beam Laser Interference Patterning

Author(s): Wang, Yunran; Jin, Chaoyuan; Hopkinson, Mark
Published in: IET Optoelectronics, Issue 1, 2018, ISSN 1751-8776
DOI: 10.5281/zenodo.1477681