Resultado final
Open Data associated with the empirical evaluation.
Publicaciones
Autores:
Mariano Ceccato, Davide Corradini, Luca Gazzola, Fitsum Meshesha Kifetew, Leonardo Mariani, Matteo Orru, Paolo Tonella
Publicado en:
2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST), 2020, Página(s) 286-296, ISBN 978-1-7281-5778-8
Editor:
IEEE
DOI:
10.1109/icst46399.2020.00037
Autores:
Gunel Jahangirova, Paolo Tonella
Publicado en:
2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST), 2020, Página(s) 74-84, ISBN 978-1-7281-5778-8
Editor:
IEEE
DOI:
10.1109/icst46399.2020.00018
Autores:
Jinhan Kim, Nargiz Humbatova, Gunel Jahangirova, Paolo Tonella, Shin Yoo
Publicado en:
Proceedings of the IEEE Conference on Software Testing, Verification and Validation, 2023, Página(s) pp. 234-245
Editor:
IEEE
DOI:
10.1109/icst57152.2023.00030
Autores:
Vincenzo Riccio, Paolo Tonella
Publicado en:
Proceedings of the 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, 2020, Página(s) 876-888, ISBN 9781450370431
Editor:
ACM
DOI:
10.1145/3368089.3409730
Autores:
Valerio Terragni, Gunel Jahangirova, Paolo Tonella, Mauro Pezzè
Publicado en:
Proceedings of the 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, 2020, Página(s) 1178-1189, ISBN 9781450370431
Editor:
ACM
DOI:
10.1145/3368089.3409758
Autores:
Gunel Jahangirova, Andrea Stocco, Paolo Tonella
Publicado en:
2021 14th IEEE Conference on Software Testing, Verification and Validation (ICST), 2021, Página(s) 194-204, ISBN 978-1-7281-6836-4
Editor:
IEEE
DOI:
10.1109/icst49551.2021.00030
Autores:
Tahereh Zohdinasab, Vincenzo Riccio, Alessio Gambi, Paolo Tonella
Publicado en:
Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis, 2021, Página(s) 79-90, ISBN 9781450384599
Editor:
ACM
DOI:
10.1145/3460319.3464811
Autores:
Michael Weiss, Rwiddhi Chakraborty, Paolo Tonella
Publicado en:
2021 IEEE/ACM Third International Workshop on Deep Learning for Testing and Testing for Deep Learning (DeepTest), 2021, Página(s) 17-24, ISBN 978-1-6654-4565-8
Editor:
IEEE
DOI:
10.1109/deeptest52559.2021.00009
Autores:
Antonia Bertolino, Guglielmo De Angelis, Breno Miranda, Paolo Tonella
Publicado en:
2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST), 2020, Página(s) 454-459, ISBN 978-1-7281-5778-8
Editor:
IEEE
DOI:
10.1109/icst46399.2020.00061
Autores:
Michael Weiss, Paolo Tonella
Publicado en:
2021 14th IEEE Conference on Software Testing, Verification and Validation (ICST), 2021, Página(s) 24-35, ISBN 978-1-7281-6836-4
Editor:
IEEE
DOI:
10.1109/icst49551.2021.00015
Autores:
Michael Weiss, Paolo Tonella
Publicado en:
2021 14th IEEE Conference on Software Testing, Verification and Validation (ICST), 2021, Página(s) 436-441, ISBN 978-1-7281-6836-4
Editor:
IEEE
DOI:
10.1109/icst49551.2021.00056
Autores:
Michael Weiss, Paolo Tonella
Publicado en:
Proceedings of the 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, 2022, Página(s) pp. 139-150
Editor:
ACM
DOI:
10.1145/3533767.3534375
Autores:
Nargiz Humbatova, Gunel Jahangirova, Paolo Tonella
Publicado en:
Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis, 2021, Página(s) 67-78, ISBN 9781450384599
Editor:
ACM
DOI:
10.1145/3460319.3464825
Autores:
Vincenzo Riccio, Nargiz Humbatova, Gunel Jahangirova, Paolo Tonella
Publicado en:
2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE), 2021, Página(s) 355-367
Editor:
IEEE Computer Society
DOI:
10.1109/ase51524.2021.9678764
Autores:
Andrea Stocco, Michael Weiss, Marco Calzana, Paolo Tonella
Publicado en:
Proceedings of the ACM/IEEE 42nd International Conference on Software Engineering, 2020, Página(s) 359-371, ISBN 9781450371216
Editor:
ACM
DOI:
10.1145/3377811.3380353
Autores:
Andrea Romdhana, Mariano Ceccato, Alessio Merlo, Paolo Tonella
Publicado en:
2022 IEEE Conference on Software Testing, Verification and Validation (ICST), 2022
Editor:
IEEE
DOI:
10.1109/icst53961.2022.00013
Autores:
Mariano Ceccato, Luca Gazzola, Fitsum Meshesha Kifetew, Leonardo Mariani, Matteo Orru, Paolo Tonella
Publicado en:
2019 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW), 2019, Página(s) 137-143, ISBN 978-1-7281-5138-0
Editor:
IEEE
DOI:
10.1109/issrew.2019.00063
Autores:
Andrea Stocco, Paulo J. Nunes, Marcelo d'Amorim, Paolo Tonella
Publicado en:
Proceedings of the 37th IEEE/ACM International Conference on Automated Software Engineering (ASE), 2022
Editor:
ACM
DOI:
10.1145/3551349.3556968
Autores:
Nargiz Humbatova, Gunel Jahangirova, Gabriele Bavota, Vincenzo Riccio, Andrea Stocco, Paolo Tonella
Publicado en:
Proceedings of the ACM/IEEE 42nd International Conference on Software Engineering, 2020, Página(s) 1110-1121, ISBN 9781450371216
Editor:
ACM
DOI:
10.1145/3377811.3380395
Autores:
Sajad Khatiri, Sebastiano Panichella, Paolo Tonella
Publicado en:
Proceedings of the IEEE Conference on Software Testing, Verification and Validation, 2023, Página(s) pp. 281-292
Editor:
IEEE
DOI:
10.1109/icst57152.2023.00034
Autores:
Valerio Terragni, Gunel Jahangirova, Paolo Tonella, Mauro Pezze
Publicado en:
2021 IEEE/ACM 43rd International Conference on Software Engineering: Companion Proceedings (ICSE-Companion), 2021, Página(s) 85-88, ISBN 978-1-6654-1219-3
Editor:
IEEE
DOI:
10.1109/icse-companion52605.2021.00042
Autores:
Andrea Stocco, Paolo Tonella
Publicado en:
Journal of Software: Evolution and Process, 2021, ISSN 2047-7481
Editor:
John Wiley and Sons Ltd
DOI:
10.1002/smr.2386
Autores:
Andrea Stocco, Brian Pulfer, Paolo Tonella
Publicado en:
Empirical Software Engineering, Edición vol. 28, n. 3, 2023, ISSN 1382-3256
Editor:
Kluwer Academic Publishers
DOI:
10.1007/s10664-023-10306-x
Autores:
Tahereh Zohdinasab, Vincenzo Riccio, Alessio Gambi, Paolo Tonella
Publicado en:
ACM Transactions on Software Engineering and Methodology, Edición vol. 32, n. 2, 2023, Página(s) 1-38, ISSN 1049-331X
Editor:
Association for Computing Machinary, Inc.
DOI:
10.1145/3544792
Autores:
Andrea Romdhana, Alessio Merlo, Mariano Ceccato, Paolo Tonella
Publicado en:
Computer Security, Edición vol. 131, 2023, ISSN 0167-4048
Editor:
Pergamon Press Ltd.
DOI:
10.1016/j.cose.2023.103311
Autores:
Michael Weiss, Paolo Tonella
Publicado en:
Journal of Software: Testing, Verification and Reliability, 2023, Página(s) 1-23, ISSN 1099-1689
Editor:
John Wiley & Sons
DOI:
10.1002/stvr.1840
Autores:
Matteo Biagiola, Paolo Tonella
Publicado en:
ACM Transactions on Software Engineering and Methodology, Edición vol. 31, n. 4, 2022, Página(s) 1-46, ISSN 1049-331X
Editor:
Association for Computing Machinary, Inc.
DOI:
10.1145/3511701
Autores:
Vincenzo Riccio, Gunel Jahangirova, Andrea Stocco, Nargiz Humbatova, Michael Weiss, Paolo Tonella
Publicado en:
Empirical Software Engineering, Edición 25/6, 2020, Página(s) 5193-5254, ISSN 1382-3256
Editor:
Kluwer Academic Publishers
DOI:
10.1007/s10664-020-09881-0
Autores:
Gunel Jahangirova, David Clark, Mark Harman, Paolo Tonella
Publicado en:
IEEE Transactions on Software Engineering, 2019, Página(s) 1-1, ISSN 0098-5589
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tse.2019.2934409
Autores:
Antonia Bertolino, Pietro Braione, Guglielmo De Angelis, Luca Gazzola, Fitsum Kifetew, Leonardo Mariani, Matteo Orrù, Mauro Pezzè, Roberto Pietrantuono, Stefano Russo, Paolo Tonella
Publicado en:
ACM Computing Surveys, Edición 54/5, 2021, Página(s) 1-39, ISSN 0360-0300
Editor:
Association for Computing Machinary, Inc.
DOI:
10.1145/3447240
Autores:
Andrea Stocco, Brian Pulfer, Paolo Tonella
Publicado en:
IEEE Transactions on Software Engineering, Edición vol. 49, n. 4, 2023, Página(s) pp. 1928-1940, ISSN 0098-5589
Editor:
Institute of Electrical and Electronics Engineers
DOI:
10.1109/tse.2022.3202311
Autores:
Andrea Romdhana, Alessio Merlo, Mariano Ceccato, Paolo Tonella
Publicado en:
ACM Transactions on Software Engineering and Methodology, 2022, ISSN 1049-331X
Editor:
Association for Computing Machinary, Inc.
DOI:
10.1145/3502868
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