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Crosspoint In-memoRy CompUting Systems

Publicaciones

A Drift-Resilient Hardware Implementation of Neural Accelerators Based on Phase Change Memory Devices

Autores: I. Muñoz-Martín, S. Bianchi, O. Melnic, A. G. Bonfanti, D. Ielmini
Publicado en: IEEE Transactions on Electron Devices, 2021, ISSN 0018-9383
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/ted.2021.3118996

A Spiking Recurrent Neural Network With Phase-Change Memory Neurons and Synapses for the Accelerated Solution of Constraint Satisfaction Problems

Autores: Giacomo Pedretti, Piergiulio Mannocci, Shahin Hashemkhani, Valerio Milo, Octavian Melnic, Elisabetta Chicca, Daniele Ielmini
Publicado en: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Issue 6/1, 2020, Page(s) 89-97, ISSN 2329-9231
Editor: IEEE
DOI: 10.1109/jxcdc.2020.2992691

Redundancy and Analog Slicing for Precise In-Memory Machine Learning—Part II: Applications and Benchmark

Autores: Pedretti, G.; Mannocci, P.; Li, C.; Sun, Z.; Strachan, J. P.; Ielmini, D.
Publicado en: Crossref, Issue 1, 2021, ISSN 0018-9383
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/ted.2021.3095430

A Universal, Analog, In-Memory Computing Primitive for Linear Algebra Using Memristors

Autores: P. Mannocci, G. Pedretti, E. Giannone, E. Melacarne, Z. Sun, D. Ielmini
Publicado en: IEEE Transactions on Circuits and Systems I: Regular Papers, 2021, ISSN 1549-8328
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/tcsi.2021.3122278

Time Complexity of In-Memory Solution of Linear Systems

Autores: Zhong Sun, Giacomo Pedretti, Piergiulio Mannocci, Elia Ambrosi, Alessandro Bricalli, Daniele Ielmini
Publicado en: IEEE Transactions on Electron Devices, Issue 67/7, 2020, Page(s) 2945-2951, ISSN 0018-9383
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/ted.2020.2992435

Redundancy and Analog Slicing for Precise In-Memory Machine Learning—Part I: Programming Techniques

Autores: Pedretti, G.; Mannocci, P.; Li, C.; Sun, Z.; Strachan, J. P.; Ielmini, D.
Publicado en: Crossref, Issue 2, 2021, ISSN 0018-9383
Editor: Institute of Electrical and Electronics Engineers
DOI: 10.1109/ted.2021.3095433

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