With the growing energy comsuption of digital technologies, new routes are explored in order to develop efficient and low power consuming devices. In particular, spintronics is now turning to antiferromagnets, materials with fast dynamics, robust to parasitic fields and which can be manipulated at low power.
However, the study of the magnetic states in antiferromagnets is hindered by the difficulty to image them in real space with most of the available microscopy techniques. The recently developed nitrogen-vacancy (NV) center magnetometry appears to be a solution to this problem. It probes the magnetic order via the measurement of the stray field present at the surface of the sample. The field is measured using the Zeeman shifts of the electronic spin sublevels of a single nitrogen-vacancy defect in diamond. The single NV defect is placed at the apex of a nanopillar in a diamond tip integrated into an atomic force microscope, allowing to scan in close proximity to the sample surface.
The project aims at the direct imaging of nanoscale antiferromagnetic textures using NV-center magnetometry, in particular in synthetic antiferromagnets as well as in bismuth ferrite. A further objective is the demonstration of the manipulation of the magnetic states using epitaxial strain, electric field and spin currents.