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Scattering-Based X-ray Imaging and Tomography

Publications

Unified Modulation Pattern Analysis (UMPA) algorithm for 1D sensitive X-ray phase contrast imaging techniques

Author(s): Vittorio Di Trapani, Luca Brombal, Fabio De Marco, Diego Dreossi, Pierre Thibault
Published in: Journal of Instrumentation, 2023, ISSN 1748-0221
Publisher: Institute of Physics
DOI: 10.1088/1748-0221/18/01/c01059

Ptychographic wavefront characterisation for single-particle imaging at X-ray lasers

Author(s): Daurer, Benedikt J.; Sala, Simone; Hantke, Max F.; Reddy, Hemanth K. N.; Bielecki, Johan; Shen, Zhou; Nettleblad, Carl; Svenda, Martin; Ekeberg, Tomas; Carini, Gabriella A.; Hart, Philip; Osipov, Timur; Aquila, Andrew; Loh, N. Duane; Maia, Filipe R. N. C.; Thibault, Pierre
Published in: Optica, 2021, ISSN 2334-2536
Publisher: Optica Publishing Group
DOI: 10.1364/optica.416655

X-ray directional dark-field imaging using <i>Unified Modulated Pattern Analysis</i>

Author(s): Ronan Smith; Fabio De Marco; Ludovic Broche; Marie-Christine Zdora; Nicholas W. Phillips; Richard Boardman; Pierre Thibault
Published in: PLoS ONE, 2022, ISSN 1932-6203
Publisher: Public Library of Science
DOI: 10.1371/journal.pone.0273315

Phase-Vortex Removal for Quantitative X-Ray Nanotomography with Near-Field Ptychography

Author(s): Irene Zanette; Irene Zanette; Richard Clare; Richard Clare; David S. Eastwood; Charan Venkata; Franz Pfeiffer; Peter Cloetens; Pierre Thibault; Pierre Thibault
Published in: Physical Review Applied, 2021, ISSN 2331-7019
Publisher: American Physical Society (APS)
DOI: 10.1103/physrevapplied.14.064078

Comparing x-ray phase-contrast imaging using a Talbot array illuminator to propagation-based imaging for non-homogeneous biomedical samples

Author(s): Mirko Riedel, Kirsten Taphorn, Alex Gustschin, Madleen Busse, Joerg U. Hammel, Julian Moosmann, Felix Beckmann, Florian Fischer, Pierre Thibault, Julia Herzen
Published in: Scientific Reports, Issue 13, 2023, ISSN 2045-2322
Publisher: Nature Publishing Group
DOI: 10.1038/s41598-023-33788-7

Speckle-based directional dark-field x-ray imaging with a liquid-metal-jet source

Author(s): Ronan Smith, Richard Boardman, Pierre Thibault
Published in: AIP Conference Proceedings, Issue 2990, 2023, ISSN 1551-7616
Publisher: American Institute of Physics
DOI: 10.1063/5.0168156

Three-dimensional coherent diffraction snapshot imaging using extreme-ultraviolet radiation from a free electron laser

Author(s): Danny Fainozzi; Matteo Ippoliti; Fulvio Bille; Dario De Angelis; Laura Foglia; Claudio Masciovecchio; Riccardo Mincigrucci; Matteo Pancaldi; Emanuele Pedersoli; Christian M. Günther; Bastian Pfau; Michael Schneider; Clemens Von Korff Schmising; Stefan Eisebitt; George Kourousias; Filippo Bencivenga; Flavio Capotondi
Published in: Optica, Issue 10, 2023, ISSN 2334-2536
Publisher: Optica Publishing Group
DOI: 10.1364/optica.492730

High-speed processing of X-ray wavefront marking data with the Unified Modulated Pattern Analysis (UMPA) model

Author(s): Sara Savatović; Marco Margini; Vittorio Di Trapani; GINEVRA LAUTIZI; Fabio De Marco; Pierre Thibault; Ronan Smith
Published in: Optics express, 2022, ISSN 1094-4087
Publisher: Optical Society of America
DOI: 10.1364/oe.474794

High resolution and sensitivity bi-directional x-ray phase contrast imaging using 2D Talbot array illuminators

Author(s): Alex Gustschin; Mirko Riedel; Kirsten Taphorn; Christian Petrich; Wolfgang Noichl; Wolfgang Gottwald; Madleen Busse; Sheila E. Francis; Felix Beckmann; Jörg U. Hammel; Julian Moosmann; Pierre Thibault; Julia Herzen
Published in: Optica, Issue 2, 2021, ISSN 2334-2536
Publisher: The Optical Society
DOI: 10.3204/pubdb-2021-05291

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