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Automated synthesis methodology for reliable RF integrated circuits

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Publications

Addressing a New Class of Multi-Objective Passive Device Optimization for Radiofrequency Circuit Design

Author(s): Fabio Passos, Elisenda Roca, Rafael Castro-López and Francisco V. Fernández
Published in: Electronics MDPI, "Special Issue in ""Advanced Design Techniques and EDA Methodologies for Analog, RF and MM-Wave Circuit Design""", 2022, Page(s) 2624, ISSN 2079-9292
Publisher: MDPI
DOI: 10.3390/electronics11162624

Hierarchical Yield-aware Synthesis Methodology Covering Device-, Circuit-, and System-level for Radiofrequency ICs

Author(s): Antonio Canelas, Fabio Passos, Nuno Lourenco, Ricardo Martins, Elisenda Roca, Rafael Castro-Lopez, Nuno Horta, Francisco V. Fernandez
Published in: IEEE Access, 2021, Page(s) 1-1, ISSN 2169-3536
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI: 10.1109/access.2021.3110758

Machine Learning Approaches for Transformer Modeling

Author(s): F. Passos; N. Lourenço; R. Martins; E. Roca; R. Castro-López; N. Horta; F. V. Fernández
Published in: SMACD Conference, 2022
Publisher: IEEE
DOI: 10.1109/smacd55068.2022.9816303

A Radiation-Hardened Frequency–Locked Loop On–Chip Oscillator with 33.6ppm/°C Stability for Space Applications

Author(s): F. Passos; R. Vieira; A. Canelas; R. Póvoa; N. Lourenço; N. Horta; J. Guilherme
Published in: ISCAS Conference, 2022, ISBN 978-1-6654-8485-5
Publisher: IEEE
DOI: 10.1109/iscas48785.2022.9937971

Automatic Design of High-Gain 26.5-to-29.5-GHz Transformer-Less Low-Noise Amplifier 1.86-to-8.87-mW Variants in 65-nm CMOS

Author(s): Luís Mendes; João Vaz; Fábio Passos; Nuno Lourenço; Ricardo Martins
Published in: ISCAS Conference, 2022, ISBN 978-1-6654-8485-5
Publisher: IEEE
DOI: 10.1109/iscas48785.2022.9937230

Radiation-Hardened Bandgap Voltage and Current Reference for Space Applications with 2.38 ppm/C Temperature Coefficient

Author(s): Nuno Lourenço; Fábio Passos; Rafael Vieira; Ricardo Martins; Nuno Horta; Jorge Guilherme; Ricardo Póvoa
Published in: SMACD Conference, 2022
Publisher: IEEE
DOI: 10.1109/smacd55068.2022.9816300