Periodic Reporting for period 1 - AdOptEx (Translation of adaptive optical microscopy expertise to the commercial domain)
Período documentado: 2021-03-01 hasta 2023-02-28
Adaptive optics (AO) is an important technology for high-resolution microscopy. AO overcomes problems when imaging inside biological specimens, where refractive index variations cause optical aberrations that affect image resolution and contrast. Through the ERC Advanced Grant AdOMiS we have developed and experimentally validated new, broadly applicable AO tools that make integration of this technology more practical for a range of different microscopy techniques. A remaining challenge was to translate these laboratory-based methods and know-how outside the academic research environment. This technology could then become the norm even in commercial microscopes, ultimately providing improved tools for everyday use in biomedical research. Through the AdOptEx proof of concept project, we have addressed various questions about the translation of AO technology into the commercial domain.
Novel AO control methods were developed for a compact add-on module that was combined with a commercial widefield sectioning microscope system. The novel methods were also combined with other microscopes for demonstration purposes. This provided the basis for further collection of imaging data that could showcase the effectiveness of AO aberration correction in a range of applications ranging from cell biology to neuroscience. Such demonstrations are important in attracting the interest of potential commercial partners in the further exploitation, with the aim of bringing the technology to a wider user base.
To further support the commercialisation process, we collated a portfolio of intellectual property to aid industrial engagement. This incorporated patents, designs, software and broader know-how that are related to incorporating various AO techniques into different microscopic systems, especially commercial instruments. In parallel, we undertook market analyses and developed further our industry network, building upon existing commercial relationships. Through this process we secured demonstration projects and expanded our network of potential clients and academic partnerships, in addition to investor engagement.
Based upon these outputs a plan is in place to set up a spin-out company that meets the needs of potential AO adopters. This will cover outsourcing of industrial R&D effort necessary to successfully deploy AO in their systems and long term support for this technology in the field.
Novel AO control methods were developed for a compact add-on module that was combined with a commercial widefield sectioning microscope system. The novel methods were also combined with other microscopes for demonstration purposes. This provided the basis for further collection of imaging data that could showcase the effectiveness of AO aberration correction in a range of applications ranging from cell biology to neuroscience. Such demonstrations are important in attracting the interest of potential commercial partners in the further exploitation, with the aim of bringing the technology to a wider user base.
To further support the commercialisation process, we collated a portfolio of intellectual property to aid industrial engagement. This incorporated patents, designs, software and broader know-how that are related to incorporating various AO techniques into different microscopic systems, especially commercial instruments. In parallel, we undertook market analyses and developed further our industry network, building upon existing commercial relationships. Through this process we secured demonstration projects and expanded our network of potential clients and academic partnerships, in addition to investor engagement.
Based upon these outputs a plan is in place to set up a spin-out company that meets the needs of potential AO adopters. This will cover outsourcing of industrial R&D effort necessary to successfully deploy AO in their systems and long term support for this technology in the field.