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Reliability of Advanced High Power Semiconductor Devices for Railway Traction Applications

Objective



Objectives and content

Power modules in IGBT (insulated gate bipolar transistor) technology are now at the threshold of their introduction to railway traction appilcations. Owing to the very rigorous operating conditions involved, above all the large temperature fluctuations between winter and summer and the frequency of the on and off states, very high demands are made on the reliability of these power devices: thus they must operate for 35 years without failures. However, the number of power devices used in railway traction applications will always be relatively small, so that the reliability requirements cannot be simply verified by experiment.
Hence the concept of buiit-In reliability must be consistently implemented. The core of the activities planned for the project therefore consists of the elaboration of accelerated reliability tests, whose scientific basis consists of the failure mechanisms and the corresponding models.
The requirements profiles of the tests are determined from the line profiles under normal and abnormal operating conditions. The end-users, i.e. the railway operators, will be involved in the work of defining the line profiles. All major applications, from tramways to high-speed trains, will be examined in this process. In addition to testing the IGBT power modules separately, it appears to be particularly important to test them within the system as well. To this end, assemblies for worst-case operation (AWCOs) are to be developed and operated for test purposes.

Planned flanking measures include work on alternative contacting techniques as well as an investigation into whether any reliability indicators exist that allow module degradation to be indicated in a simple way. The reliability simulation of the system should permit a reliability prediction to be made on the basis of models for failure modes. All these activities should result in the concluding of an agreement on standardized reliability tests by the end-users (railway operators), the power semiconductor manufacturers and the transportation industry. This agreement should then be proposed as an IE standard.

Coordinator

EUPEC GMBH & CO. KGAA
Address
5,Max-planck-strasse 5
59581 Warstein
Germany

Participants (15)

ABB Semiconductors AG
Switzerland
Address
3,Fabrikstrasse
5600 Lenzburg
ANSALDO RICERCHE SPA*
Italy
Address
Corso Perrone 25
16152 Genova
Ansaldo Trasporti SpA
Italy
Address
Via N. Lorenzi 8
16152 Genova
Asea Brown Boveri Limited
Switzerland
Address

5405 Baden
Deutsche Bahn AG
Germany
Address
59,Ruschestrasse
10365 Berlin
Ecole Nationale Supérieure d'Electronique et de Radioélectricité de Bordeaux
France
Address
351,Cours De La Libération 351
33405 Talence
Eidgenössische Technische Hochschule - ETH Zürich
Switzerland
Address
35,Gloriastrasse
8092 Zürich
Ferrovie dello Stato SpA
Italy
Address
Via Casarini 25
40131 Bologna
GEC Plessey Semiconductors plc
United Kingdom
Address
Carholme Road
LN1 1SG Lincoln
INSTITUT NATIONAL DE RECHERCHE SUR LES TRANSPORTS ET LEUR SCURIT
France
Address
Avenue Du Gtntral Malleret-joinville
94114 Arcueil
Siemens AG
Germany
Address
6,Otto-hahn-ring
81730 München
Société Nationale des Chemins de Fer Français
France
Address
15,Rue Travensière
75012 Paris
University of Cambridge
United Kingdom
Address
Trumpington Street
CB2 1PZ Cambridge
Università degli Studi di Parma
Italy
Address
Viale Delle Scienze
43100 Parma
Universität Dortmund
Germany
Address
68,Emil-figge Strasse
44227 Dortmund