Paper designs for RF inductors making use of high aspect ratio conductors have been produced. These designs have been produced as a result of a design study conducted using analytical design equation and numerical simulation tools. Currently these designs have been circulated to the other partners responsible for their fabrication.
RF inductors find application in almost all of today's wireless communications equipment, such as cellular phones, pagers, wireless LAN, GPS systems etc. The end users for these components are therefore likely to be component manufacturers or wireless communication equipment manufacturers. The main requirements for components used in these applications are small size, high quality factor, tight tolerance, and high operating frequencies.
Currently most RF inductors are fabricated using one of four technologies, wire winding, multi-layer ceramic, thin film, or the recently introduced laser patterning. In general wire wound inductors offer the highest quality factors, but tight tolerance is achieved by screening of the components. In contrast to this thin film technology can produce tight tolerance components, but the inductance achievable in any chip size is more limited. High aspect ration inductors fabricated using the LAMAR process should hopefully offer the tight tolerance of this film technology. Also the results of this design study for the high aspect ratio inductors predict that the quality factor of the high aspect ratio inductors are 20-30% greater than those of commercially available thin film inductors and therefore match the Q-factors achievable from wire-wound inductors.
Potential Barriers to the adoption of component fabricated using the LAMAR process include:
- The tolerance achievable (tolerances of better that 2% on the inductance value are required).
- Increasing trend towards the integration of inductors on chip and hence the elimination of the discrete component.