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Content archived on 2022-12-23

Unified Built In Self Test Approach For Full Defect Testing in Mixed Signal (Analogue-Digital-Mixed) Devices

Objective

The objective of this research is to develop a complete test strategy and system for self testing mixed signal design, for use in the development of self testing mixed signal devices.

The system will consist of a test pattern generation and evaluation unit, a dedicated fault effect monitor and the necessary analogue and digital functional units. The approach is based on current monitoring, a testing technique which can be used for both analogue and digital designs. All results will be evaluated on practical designs.

European links:

ESPRIT project 6575 (ATSEC) Advanced Test generation and testable design methodology for Sequential Circuits.

INFORMATION DISSEMINATION ACTIVITIES AND EXPLOITATION

Results will be disseminated through published papers and conferences, and workshops for industry.

Topic(s)

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Call for proposal

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Coordinator

Katholieke Industriële Hogeschool West-Vlaanderen
EU contribution
No data
Address
Zeedijk 101
8400 Oostende
Belgium

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Total cost
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Participants (5)