Quantification of additives at polymer surfaces by tof sims (ADDIQUANTOF)

Objective

Statistic ToF-SIMS is the most powerful technique available for the characterization of additives at polymers surfaces. Quantification, however, is hampered by the so-called matrix effect. For a number of selected polymer additives model systems of high industrial importance we will develop standards, optimize the ion yields by optimizing the primary ion properties (energy and composition), determine the relationship between secondary ion peak intensities and surface concentration for different additives in different polymer matrixes, perform a systematic peak interpretation, and will try to develop on the base of these results, a general algorithm for the quantification of additives in polymers by ToF-SIMS. The excellent and complementary expertise of the four partners in the different fields (instrumentation, spectra interpretation, imaging, data acquisition, multivariate analysis) presents an optimum base for solving these problems of quantification.

Programme(s)

• FP5-GROWTH - Programme for research technological development and demonstration on "Competitive and sustainable growth 1998-2002"

Topic(s)

• 1.1.3.-6. - RTD Activities of a Generic Nature : Measurements and Testing

Funding Scheme

CSC - Cost-sharing contracts

Coordinator

BIOPHY RESEARCH SA

Address

Village D'entreprises De Saint Henri, 6 Rue Anne G
13016 Marseille
France

Participants (3)

ION-TOF - GESELLSCHAFT FUER MASSENSPEKTROMETER

Germany

Address

Mendelstrasse 11
48149 Muenster

UNIVERSITE CATHOLIQUE DE LOUVAIN

Belgium

Address

1,Place Croix Du Sud 1, Boltzmann
1348 Louvain-la-neuve

UNIVERSITY OF CATANIA

Italy

Address

Viale A. Doria 6
95125 Catania