Statistic ToF-SIMS is the most powerful technique available for the characterization of additives at polymers surfaces. Quantification, however, is hampered by the so-called matrix effect. For a number of selected polymer additives model systems of high industrial importance we will develop standards, optimize the ion yields by optimizing the primary ion properties (energy and composition), determine the relationship between secondary ion peak intensities and surface concentration for different additives in different polymer matrixes, perform a systematic peak interpretation, and will try to develop on the base of these results, a general algorithm for the quantification of additives in polymers by ToF-SIMS. The excellent and complementary expertise of the four partners in the different fields (instrumentation, spectra interpretation, imaging, data acquisition, multivariate analysis) presents an optimum base for solving these problems of quantification.
Funding SchemeCSC - Cost-sharing contracts